Hostname: page-component-6898cfcb55-zsp5v Total loading time: 0 Render date: 2026-11-11T07:34:30.546Z Has data issue: false hasContentIssue false

X-Ray Fluorescence Analysis of Geological Materials Using Rousseau's Fundamental Algorithm

Published online by Cambridge University Press:  06 March 2019

R. G. Johnson*
Affiliation:
U.S. Geological Survey, National Center 957, Reston, Virginia 22092
Get access

Extract

The analysis of many types of geological samples by X- ray fluorescence (XRF) spectroscopy has become routine. For example, the analysis of major elements in silicate rocks is not a problem because of the large number of standard reference materials available, and because of the benefits of the fusion preparation. Even simple linear regression analysis provides accurate results when standards and samples are similar.

Information

Type
III. XRF Fundamental Parameters and Data Analysis
Copyright
Copyright © International Centre for Diffraction Data 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable