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X-Ray Texture Measurement Using a Position Sensitive Detector

Published online by Cambridge University Press:  06 March 2019

L. Wcislak ,
H.J. Bunge ,
M. Haase  and
C. Nauer-Gerhardt
L. Wcislak
Affiliation:
Department of Physical Metallurgy Technical University of Clausthal, FRG
H.J. Bunge
Affiliation:
Department of Physical Metallurgy Technical University of Clausthal, FRG
M. Haase
Affiliation:
Siemens Analytical, Siemens AG, Karlsruhe, FRG
C. Nauer-Gerhardt
Affiliation:
Siemens Analytical, Siemens AG, Karlsruhe, FRG
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Abstract

For pole figure measurement the flat sample has to be tilted which leads to peak broadening and peak overlap in peak-reach diffraction spectra. Using a linear position sensitive detector /PSD/, complete diffraction spectra can be obtained in each sample orientation. Peak separation can then be done by Gaussian fitting. When measuring with a PSD, each diffraction peak corresponds to a particular diffraction vector. This has to be taken into consideration by a coordinate transformation. The PSD-method is the only practical method of texture measurement for materials with complex diffraction spectra.

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References

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