Hostname: page-component-74656f9884-c52kr Total loading time: 0 Render date: 2026-11-07T18:01:01.180Z Has data issue: false hasContentIssue false
  • English
  • Français

Long-term memory span

Published online by Cambridge University Press:  30 October 2001

James S. Nairne  and
Ian Neath
James S. Nairne
Affiliation:
Department of Psychology, Purdue University, West Lafayette, IN 47907-1364 nairne@psych.purdue.edu neath@psych.purdue.edu www.psych.purdue.edu/~nairne www.psych.purdue.edu/~neath
Ian Neath
Affiliation:
Department of Psychology, Purdue University, West Lafayette, IN 47907-1364 nairne@psych.purdue.edu neath@psych.purdue.edu www.psych.purdue.edu/~nairne www.psych.purdue.edu/~neath
Rights & Permissions [Opens in a new window]

Abstract

Core share and HTML view are not available for this content. However, as you have access to this content, a full PDF is available via the 'Save PDF' action button.

Cowan assumes that chunk-based capacity limits are synonymous with the essence of a “specialized STM mechanism.” In a single experiment, we measured the capacity, or span, of long-term memory and found that it, too, corresponds roughly to the magical number 4. The results imply that a chunk-based capacity limit is not a signature characteristic of remembering over the short-term.

Information

Type
Brief Report
Information
Behavioral and Brain Sciences , Volume 24 , Issue 1 , February 2001 , pp. 134 - 135
Copyright
© 2001 Cambridge University Press