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Layer charge estimation of smectites using infrared spectroscopy

Published online by Cambridge University Press:  09 July 2018

S. Petit ,
D. Righi ,
J. Madejová  and
A. Decarreau
S. Petit
Affiliation:
Université de Poitiers, CNRS UMR 6532 ‘HydrASA’, 40, avenuedu Recteur Pineau, F-86022 Poitiers Cedex, France
D. Righi
Affiliation:
Université de Poitiers, CNRS UMR 6532 ‘HydrASA’, 40, avenuedu Recteur Pineau, F-86022 Poitiers Cedex, France
J. Madejová
Affiliation:
Institute of Inorganic Chemistry, Slovak Academy of Sciences, 842 36 Bratislava, Slovakia
A. Decarreau
Affiliation:
Université de Poitiers, CNRS UMR 6532 ‘HydrASA’, 40, avenuedu Recteur Pineau, F-86022 Poitiers Cedex, France
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Abstract

A new method of measuring the layer charge of smectites by IR spectroscopy is proposed based on the integrated intensity measurement of the band assigned to the ammonium fundamental ν4 mode of NH+ 4-exchanged clays. Measurements are made before and after Li fixation (Hofman & Klemen effect). These allow the quantitative determination of the total charge, equivalent to CEC, and tetrahedral and octahedral charge distribution in both dioctahedral and trioctahedral smectites.

Information

Type
Research Article
Information
Clay Minerals , Volume 33 , Issue 4 , December 1998 , pp. 579 - 591
Copyright
Copyright © The Mineralogical Society of Great Britain and Ireland 1998

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