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Rapid, Accurate Phase Quantification of Clay-Bearing Samples using a Position-Sensitive X-Ray Detector

Published online by Cambridge University Press:  28 February 2024

Meryl Batchelder and
Gordon Cressey
Meryl Batchelder
Affiliation:
Department of Mineralogy, The Natural History Museum, Cromwell Road, London, SW7 5BD, UK
Gordon Cressey
Affiliation:
Department of Mineralogy, The Natural History Museum, Cromwell Road, London, SW7 5BD, UK
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Abstract

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The rapid phase quantification method using X-ray diffraction (XRD) with a position-sensitive detector (PSD), outlined by Cressey and Schofield (1996), has been extended to facilitate mineral phase quantification of clay-bearing samples. In addition, correction factors for differences in matrix absorption effects have been calculated and applied. The method now enables mudrock mineralogy to be quantified rapidly and efficiently. Using this approach overcomes many of the problems hitherto associated with the quantitative analysis of clay minerals, in particular the effects of preferred orientation of crystallites and variable sample-area irradiation, that make the task of quantification extremely difficult by conventional Bragg-Brentano scanning diffractometry.

Keywords

Absorption CorrectionMudrocksPosition-sensitive DetectorQuantificationX-ray Diffraction

Information

Type
Research Article
Information
Clays and Clay Minerals , Volume 46 , Issue 2 , April 1998, pp. 183 - 194
Copyright
Copyright © 1998, The Clay Minerals Society

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