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Failure distributions of shock models

Published online by Cambridge University Press:  14 July 2016

Gary Gottlieb
Gary Gottlieb*
Affiliation:
New York University
*
∗ Postal address: Graduate School of Business Administration, New York University, 100 Trinity Place, New York, NY 10006, U.S.A.
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Abstract

A single device shock model is studied. The device is subject to some damage process. Under the assumption that as the cumulative damage increases, the probability that any additional damage will cause failure increases, we find sufficient conditions on the shocking process so that the life distribution will be increasing failure rate.

Keywords

SHOCK PROCESSINCREASING FAILURE RATECUMULATIVE DAMAGELIFE DISTRIBUTIONS

Information

Type
Research Papers
Information
Journal of Applied Probability , Volume 17 , Issue 3 , September 1980, pp. 745 - 752
Copyright
Copyright © Applied Probability Trust 1980 

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References

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