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Defect structure in single crystal titanium carbide

Published online by Cambridge University Press:  03 March 2011

Q.H. Zhao
Affiliation:
Department of Materials Science and Engineering, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
J. Wu
Affiliation:
Department of Electrical Engineering and Applied Physics, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
A.K. Chaddha
Affiliation:
Department of Electrical Engineering and Applied Physics, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
H.S. Chen
Affiliation:
Department of Electrical Engineering and Applied Physics, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
J.D. Parsons
Affiliation:
Department of Electrical Engineering and Applied Physics, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
D. Downham
Affiliation:
Department of Materials Science and Engineering, Oregon Graduate Inst. of Science and Technology, 20000 NW Walker Road, P.O. Box 91000, Portland, Oregon 97291–1000
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Abstract

The defects and crystallinity of as-grown and annealed TiCx (grown by the high-pressure float-zone) were examined by TEM and double crystal x-ray rocking curves. Three types of subboundaries and planar defects within subgrains were observed in as-grown TiCx. Subboundaries are classified by structure as (i) wide-extended, fault-like defects (WEFLD's), (ii) edge dislocation arrays, and (iii) dislocation networks. Planar defects were observed at dislocation nodes of subboundaries and also within subgrains; this is the first reported observation of planar defects within TiCx subgrains. The misorientation and/or density of subgrains in TiCx was reduced significantly by annealing at 2300 °C in contact with graphite.

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Copyright
Copyright © Materials Research Society 1994

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