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Oxygen self-diffusion in cerium oxide doped with Nd

Published online by Cambridge University Press:  31 January 2011

Michiyo Kamiya,
Eriko Shimada,
Yasuro Ikuma,
Manabu Komatsu,
Hajime Haneda,
Soichiro Sameshima and
Yoshihiro Hirata
Michiyo Kamiya
Affiliation:
Kanagawa Institute of Technology, 1030 Shimoogino Atsugi, Kanagawa 243-0292, Japan
Eriko Shimada
Affiliation:
Kanagawa Institute of Technology, 1030 Shimoogino Atsugi, Kanagawa 243-0292, Japan
Yasuro Ikuma
Affiliation:
Kanagawa Institute of Technology, 1030 Shimoogino Atsugi, Kanagawa 243-0292, Japan
Manabu Komatsu
Affiliation:
National Institute for Research in Inorganic Materials, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
Hajime Haneda
Affiliation:
National Institute for Research in Inorganic Materials, 1-1 Namiki Tsukuba, Ibaraki 305-0044, Japan
Soichiro Sameshima
Affiliation:
Kagoshima University, 1-21-40 Korimoto Kagoshima, Kagoshima 890-0065, Japan
Yoshihiro Hirata
Affiliation:
Kagoshima University, 1-21-40 Korimoto Kagoshima, Kagoshima 890-0065, Japan
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Abstract

Polycrystalline Ce0.77Nd0.23O1.885 having a relative density in excess of 98% was prepared. Oxygen diffusion experiments were performed for the temperature range from 750 to 1100 °C, in an oxygen partial pressure of 6.6 kPa. The concentration profile of 18O in the specimens following diffusion annealing was measured by secondary ion mass spectroscopy (SIMS). The oxygen self-diffusion coefficient obtained using secondary ion mass spectrometry was expressed by D = 6.31 × 10−9 exp(−53 kJ mol−1/RT) m2 s−1 and was in the extrinsic region. The oxygen diffusion coefficient of Ce0.77Nd0.23O1.885 was larger than that of Ce0.8Y0.2O1.90; it was close to those of Ce0.6Y0.4O1.80 and Ce0.69Gd0.31O2−δ. The oxygen diffusion coefficient obtained by the tracer method at 700 °C agreed with that calculated from the electrical conductivity in Ce0.77Nd0.23O1.885. The activation energy of the surface exchange coefficient was 94 kJ mol−1, and the values of the surface exchange coefficient were similar to those of stoichiometric CeO2 and ThO2.

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Articles
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Journal of Materials Research , Volume 16 , Issue 1 , January 2001, pp. 179 - 184
Copyright
Copyright © Materials Research Society 2001

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