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Phase identification from electronic structures by Auger electron spectroscopy

Published online by Cambridge University Press:  31 January 2011

Fuchun Xu,
Duanjun Cai and
Junyong Kang
Fuchun Xu
Affiliation:
Department of Physics and Semiconductor Photonics Research Center, Xiamen University, Xiamen 361005, China
Duanjun Cai
Affiliation:
Department of Physics and Semiconductor Photonics Research Center, Xiamen University, Xiamen 361005, China
Junyong Kang*
Affiliation:
Department of Physics and Semiconductor Photonics Research Center, Xiamen University, Xiamen 361005, China
*
a)Address all correspondence to this author. e-mail: jykang@xmu.edu.cn
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Abstract

A technique of phase identification from the characteristics of electronic structures is established by Auger electron spectroscopy. GaN epilayers in wurtzite and zinc-blende polytypes are used for practical investigations. Auger spectra show phase-dependent energetic shifts and peak intensity variations. Simulation of theoretical spectra reveals the substantial correlation of the Auger line shape with the bonding electronic states. This approach demonstrates the correspondence between electronic structure and atomic structure and hence provides criteria for phase identification.

Keywords

Auger electron spectroscopy (AES)Electronic structureSemiconducting

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Type
Articles
Information
Journal of Materials Research , Volume 23 , Issue 1 , January 2008, pp. 83 - 86
Copyright
Copyright © Materials Research Society 2008

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References

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