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X-ray diffraction study of texture in melt-processed Gd-123 as a function of 211 concentration

Published online by Cambridge University Press:  31 January 2011

E. Sudhakar Reddy,
A. K. Singh and
T. Rajasekharan
E. Sudhakar Reddy
Affiliation:
Defence Metallurgical Research Laboratory, Kanchanbagh P.O., Hyderabad-500058, India
A. K. Singh
Affiliation:
Defence Metallurgical Research Laboratory, Kanchanbagh P.O., Hyderabad-500058, India
T. Rajasekharan
Affiliation:
Defence Metallurgical Research Laboratory, Kanchanbagh P.O., Hyderabad-500058, India
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Abstract

The texture in the melt-processed GdBCO superconductor is studied as a function of Gd2BaCuO5 additions, using a texture goniometer. A systematic variation observed in the background intensity is connected to the microstructural variations and the powder x-ray diffraction spectra.

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Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 6 , June 1999, pp. 2394 - 2398
Copyright
Copyright © Materials Research Society 1999

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References

REFERENCES

1.Jin, S., Tiefel, T., Sherwood, R., van Dover, R., Davis, M., Kammlott, G., and Fastnacht, R., Phys. Rev. B 37, 7850 (1988).CrossRefGoogle Scholar
2.Murakami, M., Morita, M., and Koyama, N., Jpn. J. Appl. Phys. 28, L1125 (1989).CrossRefGoogle Scholar
3.Salma, K., Selvamanickam, V., Gao, L., and Sun, K., Appl. Phys. Lett. 54, 2352 (1989).CrossRefGoogle Scholar
4.Alexander, K.B., Goyal, A., Kroeger, D. M., Selvamanickam, V., and Salma, K., Phys. Rev. B 45, 5622 (1992).CrossRefGoogle Scholar
5.Gopalan, R., Roy, T., Rajasekharan, T., Rangarajan, G., and Haribabu, N., Physica C 244, 106 (1995).CrossRefGoogle Scholar
6.Mironova, M., Lee, D.F., and Salma, K., Physica C 211, 188 (1993).CrossRefGoogle Scholar
7.Schultz, L. G., J. Appl. Phys. 20, 1030 (1949).CrossRefGoogle Scholar
8.Sudhakar Reddy, E. and Rajasekharan, T., Supecond. Sci. Technol. 11, 183 (1998).CrossRefGoogle Scholar
9.Sudhakar Reddy, E. and Rajasekharan, T., Mater. Lett. 35, 62 (1998).CrossRefGoogle Scholar
10.Gopalan, R., Singh, A.K., Rajasekharan, T., Rangarajan, G., and Vardaraju, U. V., J. Mater. Sci. Lett. 14, 1043 (1995).CrossRefGoogle Scholar
11.Gopalan, R., Singh, A. K., and Rajasekharan, T., J. Mater. Sci. 32, 229 (1997).CrossRefGoogle Scholar
12.Kim, C.J., Kim, K. B., Chang, I.S., and Won, D.Y., J. Mater. Res. 8, 699 (1993).CrossRefGoogle Scholar
13.Alexander, K.B., Goyal, A., Kroeger, D. M., Selvamanickam, V., and Salama, K., Phys. Rev. B 45, 5622 (1992).CrossRefGoogle Scholar
14.Sandiumenge, F., Pinol, S., Obradors, X., Snoeck, E., and Roucau, C., Phys. Rev. B 50, 7032 (1994).CrossRefGoogle Scholar
15.Sudhakar Reddy, E. and Rajasekharan, T., Phys. Rev. B 57, 5079 (1998).CrossRefGoogle Scholar