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High-current laser ion source based on a low-power laser

Published online by Cambridge University Press:  25 March 2004

M. OGAWA,
M. YOSHIDA,
M. NAKAJIMA,
J. HASEGAWA,
S. FUKATA,
K. HORIOKA and
Y. OGURI
M. OGAWA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
M. YOSHIDA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
M. NAKAJIMA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8501 Japan
J. HASEGAWA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
S. FUKATA
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
K. HORIOKA
Affiliation:
Department of Energy Sciences, Tokyo Institute of Technology, Nagatsuta, Yokohama, 226-8501 Japan
Y. OGURI
Affiliation:
Research Laboratory for Nuclear Reactors, Tokyo Institute of Technology, Meguro, Tokyo 152-8550 Japan
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Abstract

An ion source for generation of low-charged heavy ions has been developed using low-power KrF excimer and frequency-doubled Nd:YAG lasers. The ion source was examined with two experimental modes of low-voltage DC extraction at ∼20 kV and high-voltage pulse extraction at 150 kV. Normalized emittance of extracted beams composed of Cu+ and Cu2+ ions was measured to be about 0.05 and 0.8 πmm-mrad for the DC extraction and the pulse extraction, respectively. Electron temperature was observed by means of a single probe method to be 0.8 to 2.5 eV, depending on the intensity of the KrF laser.

Keywords

emittanceheavy ionKrFlaserNd:YAGplasmasourcetemperature

Information

Type
Research Article
Information
Laser and Particle Beams , Volume 21 , Issue 4 , October 2003, pp. 633 - 638
Copyright
© 2003 Cambridge University Press

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References

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