Hostname: page-component-7b7567c8c-2n9c9 Total loading time: 0 Render date: 2026-11-14T18:38:17.800Z Has data issue: false hasContentIssue false

II-VI Material Integration With Silicon for Detector and PV Applications

Published online by Cambridge University Press:  06 June 2016

T.A. Gessert*
Affiliation:
EPIR Inc. Bolingbrook, IL 60440
E. Colegrove
Affiliation:
University of Illinois at Chicago, Physics Department, Chicago, IL 60612
B. Stafford
Affiliation:
University of Illinois at Chicago, Physics Department, Chicago, IL 60612
R. Kodama
Affiliation:
EPIR Inc. Bolingbrook, IL 60440
Wei Gao
Affiliation:
University of Illinois at Chicago, Physics Department, Chicago, IL 60612
H.R. Moutinho
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
D. Kuciauskas
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
R.C. Reedy
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
T.M. Barnes
Affiliation:
National Renewable Energy Laboratory, Golden, CO 80401
S. Sivananthan
Affiliation:
University of Illinois at Chicago, Physics Department, Chicago, IL 60612
*
Get access

Abstract

Heteroepitaxial growth of high-quality II-VI-alloy materials on Si substrates is a well-established commercial growth process for infrared (IR) detector devices. However, it has only recently been recognized that these same processes may have important applications for production of high-efficiency photovoltaic devices. This submission reviews the process developments that have enabled effective heteroepitaxy of II-VI alloy materials on lattice-mismatched Si for IR detectors as a foundation to describe recent efforts to apply these insights to the fabrication of multijunction Si/CdZnTe devices with ultimate conversion efficiencies >40%. Reviewed photovoltaic studies include multijunction Si/CdZnTe devices with conversion efficiency of ∼17%, analysis of structural and optoelectrical quality of undoped CdTe epilayer films on Si, and the effect that a Te-rich growth environment has on the structural and optoelectronic quality of both undoped and As-doped heteroepitaxial CdTe.

Information

Type
Articles
Copyright
Copyright © Materials Research Society 2016 

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable