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Published online by Cambridge University Press: 26 January 2016
Silicon wafers coated with a 5μm thick layer of polyimide were treatedwith different surface modification techniques such as chemical adhesionpromoters, oxygen plasma and an Ar+ sputter etch. Aftersurface modification, the wafers were molded with a 1mm thick layer of PDMS. Theadhesion of the PDMS was tested by peel testing and by using a Nordson DAGEwedge shear tester. It was found that commercially available chemical adhesionpromoters and oxygen plasma treatment resulted in a very poor PI/PDMS adhesion,whereas the Ar+ sputter etch resulted in an adhesion sostrong that the PDMS could not be delaminated from the PI surface without thefailure of the material.