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CdSe nanoparticles characterized by XRD and HRTEM in function of pH

Published online by Cambridge University Press:  21 January 2020

G. Sánchez-Legorreta,
P. Rosendo-Francisco,
J. Sumaya-Martínez,
O. Olea-Mejia and
J. L. Rodríguez López
G. Sánchez-Legorreta*
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
P. Rosendo-Francisco*
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
J. Sumaya-Martínez
Affiliation:
Facultad de Ciencias, UAEM, Campus “El Cerrillo, Piedras Blancas”. Carretera Toluca – Ixtlahuaca, Km. 15.5, CP. 50200 Toluca de Lerdo, México
O. Olea-Mejia
Affiliation:
Centro Conjunto de Investigación en Química Sustentable UAEM-UNAM. Carretera Km. 14.5, Unidad San Cayetano, Toluca - Atlacomulco, C. P. 50200 Toluca de Lerdo, México
J. L. Rodríguez López
Affiliation:
Instituto Potosino de Investigación Científica y Tecnológica, Camino a la Presa San José 2055. Col. Lomas 4 sección, CP. 78216. San Luis Potosí S.L.P
*
ag.sanchez.legorreta@gmail.com
brosendop@uaemex.mx
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Abstract

CdSe nanoparticles were grown using a colloidal method, in which the pH was the main parameter that was varied (from 8 to 12) with the objective of knowing the morphological and structural effects after the synthesis process. The samples were characterized with X-ray diffraction and High-Resolution Transmission Electron Microscope to know their crystalline structure. We identified the formation of two crystalline phases in a single sample, as well as the different crystal direction of the material, the crystallites size was calculated from the X-ray diffraction pattern using the Debye- Scherrer equation. The distance between planes was also calculated using the Fast Fourier Transformation (FFT). The results and analysis of the experimental work are reported.

Keywords

crystallographic structuretransmission electron microscopy (TEM)x-ray diffraction (XRD)

Information

Type
Articles
Information
MRS Advances , Volume 4 , Issue 53: International Materials Research Congress XXVIII , 2019, pp. 2921 - 2929
Copyright
Copyright © Materials Research Society 2020 

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