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Nanomechanical characterization of porous materials by atomic force microscopy

Published online by Cambridge University Press:  01 June 2018

D.L.P. Lacerda,
F. Ptak and
R. Prioli
D.L.P. Lacerda
Affiliation:
Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro, Marques de São Vicente 225, Rio de Janeiro, 22453-900, Rio de Janeiro, Brazil
F. Ptak
Affiliation:
Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro, Marques de São Vicente 225, Rio de Janeiro, 22453-900, Rio de Janeiro, Brazil
R. Prioli*
Affiliation:
Departamento de Física, Pontifícia Universidade Católica do Rio de Janeiro, Marques de São Vicente 225, Rio de Janeiro, 22453-900, Rio de Janeiro, Brazil
*
*(Email: rodrigo.prioli.menezes@gmail.com)
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Abstract

Atomic force microscopy (AFM) and nanoindentation were used to characterize poly (methyl methacrylate) (PMMA) films with a wide distribution of pores. Pores with diameters ranging from tens of nanometers to few micrometers were measured by AFM and cross-section scanning electron microscopy (SEM). Atomic force acoustic microscopy (AFAM) mapping of the elastic modulus were correlated with the samples topography and pore distribution. The elastic moduli of the samples were additionally measured by nanoindentation.

Keywords

polymerscanning probe microscopy (SPM)nano-indentationelastic properties

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Type
Articles
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MRS Advances , Volume 3 , Issue 44: Characterization, Modeling and Theory , 2018, pp. 2719 - 2724
Copyright
Copyright © Materials Research Society 2018 

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