Hostname: page-component-7b7567c8c-mnklg Total loading time: 0 Render date: 2026-11-12T06:20:14.260Z Has data issue: false hasContentIssue false
  • English
  • Français

Scattering Studies of “Real” Materials

Published online by Cambridge University Press:  31 January 2011

Simon C. Moss
Get access

Abstract

The following article is based on the presentation given by Simon C. Moss (University of Houston), recipient of the 2001 MRS Von Hippel Award, the Materials Research Society's highest honor, at the 2001 MRS Fall Meeting on November 28 in Boston. Moss was cited for “consistently timely and essential contributions to identifying and understanding the atomic-level structure of almost every new type of material discovered in the last 30 years.” The main unifying thread in his work is the use of diffuse scattering of x-rays and neutrons from disordered and defective solids to study their structure as well as the effects that defects have on phase transitions, whose intrinsic disorder makes them both “real” and challenging.

Keywords

bulk filmscrystalsdefectsdisorderneutron scatteringphase transitionssolidsstructurethin filmsx-ray scattering.

Information

Type
Research Article
Information
MRS Bulletin , Volume 27 , Issue 7: Vertical-Cavity Surface-Emitting Lasers , July 2002, pp. 539 - 549
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Krivoglaz, M.A., Theory of X-Ray and Thermal Neutron Scattering from Real Crystals (English translation) (Plenum Publishers, New York, 1969). An extensive update has also appeared in English translation in two volumes: X-Ray and Neutron Diffraction in Nonideal Crystals and Diffuse Scattering of X-Rays and Neutrons by Fluctuations (Springer-Verlag, Berlin, 1996).Google Scholar
2.Warren, B.E., X-Ray Diffraction (Dover Publications, New York, 1990).Google Scholar
3.Guinier, A., X-Ray Diffraction in Crystals, Imperfect Crystals, and Amorphous Bodies (Dover Publications, New York, 1994).Google Scholar
4.Schweika, W., Disordered Alloys, Diffuse Scattering, and Monte Carlo Simulation, Springer Tracts in Modern Physics, Vol. 141 (Springer-Verlag, New York, 1998).Google Scholar
5.Schönfeld, B., Prog. Mater. Sci. 44 (1999) p. 362.CrossRefGoogle Scholar
6.Moss, S.C., in Neutron Scattering in Materials Science II, edited by Neumann, D.A., Russell, T.P., and Wuensch, B.J. (Mater. Res. Soc. Symp. Proc. 376, Pittsburgh, 1995) p. 675.Google Scholar
7. For review, see Stirling, W.G. and Copper, M.J., J. Magn. Magn. Mater. 200 (1999) p. 755.CrossRefGoogle Scholar
8.Chow, P.C., Jiang, X., Reiter, G., Wochner, P., Moss, S.C., Axe, J.D., Hanson, J.C., McMullan, R.K., Meng, R.L., and Chu, C.W., Phys. Rev. Lett. 69 (1992) p. 2943.CrossRefGoogle Scholar
9.Axe, J.D., Moss, S.C., and Neumann, D.A., in Solid State Physics, Vol. 48, edited by Ehrenreich, H. and Spaepen, F. (Academic Press, New York, 1994) p. 150;Google Scholar
Axe, J.D., Chow, P.C., Moss, S.C., and Wochner, P., Physica B 219/220 (1996) p. 121.CrossRefGoogle Scholar
10.Dosch, H., Critical Phenomena at Surfaces and Interfaces, Springer Tracts in Modern Physics, Vol. 126 (Springer-Verlag, New York, 1992);CrossRefGoogle Scholar
Holy, V., Pietsch, U., and Baumbach, T., High Resolution X-Ray Scattering from Thin Films, Springer Tracts in Modern Physics, Vol. 149 (Springer-Verlag, Berlin, 1999).Google Scholar
11.Sinha, S.K., Sirota, E.B., Garoff, J., and Stanley, H.B., Phys. Rev. B 38 (1988) p. 2297.CrossRefGoogle Scholar
12.Zachariasen, W.H., Theory of X-ray Diffraction in Crystals (Dover Publications, New York, 1994).Google Scholar
13.Moncton, D.E., Axe, J.D., and DiSalvo, F.J., Phys. Rev. B 16 (1977) p. 801.CrossRefGoogle Scholar
14.Moss, S.C., Phys. Rev. Lett. 22 (1969) p. 1108;CrossRefGoogle Scholar
Moss, S.C. and Walker, R.H., J. Appl. Crystallogr. 8 (1975) p. 96.CrossRefGoogle Scholar
15.Reichert, H., Bugaev, V.N., Shchyglo, O., Sikula, Y., and Dosch, H., Phys. Rev. Lett. 87 236105 (2001).CrossRefGoogle Scholar
16.Borie, B. and Sparks, C.J., Acta Crystallogr., Sect. A 27 (1971) p. 198.CrossRefGoogle Scholar
17.Ice, G.E., Robertson, J.L., and Sparks, C.J., in Methods in Materials Research, edited by Kaufmann, E. (Wiley and Sons, New York, 2000) p. 10b2.1;Google Scholar
Ice, G.E. and Sparks, C.J., Annu. Rev. Mater. Sci. 29 (1999) p. 25.CrossRefGoogle Scholar
18.Reinhard, L., Robertson, J.L., Moss, S.C., Ice, G.E., Zschack, P., and Sparks, C.J., Phys. Rev. B 45 (1992) p. 2662.CrossRefGoogle Scholar
19.Dietrich, S. and Fenzl, W., Phys. Rev. B 39 (1989) p. 8890.Google Scholar
20.Mozer, B., Keating, D.T., and Moss, S.C., Phys. Rev. 175 (1968) p. 868.CrossRefGoogle Scholar
21.Clapp, P.C. and Moss, S.C., Phys. Rev. 142 (1966) p. 418; Phys. Rev. 171 (1968) p. 754;CrossRefGoogle Scholar
Moss, S.C. and Clapp, P.C., Phys. Rev. 171 (1968) p. 764.CrossRefGoogle Scholar
22.Brout, R.H., Phase Transitions (W.A. Benjamin, New York, 1965).Google Scholar
23.Cowley, J.M., J. Appl. Phys. 21 (1950) p. 24.CrossRefGoogle Scholar
24.Borie, B., Acta Crystallogr. 14 (1961) p. 472.CrossRefGoogle Scholar
25.Le Bolloc'h, D., Finel, A., and Caudron, R., Phys. Rev. B 62 (2000) p. 12082.Google Scholar
26.Reinhard, L. and Moss, S.C., in Proc. of the John M. Cowley Symposium, published in Ultra-microscopy 52 (1993) p. 223.Google Scholar
27.Tokar, V.I., Phys. Lett. A 110 (1985) p. 483;CrossRefGoogle Scholar
Massanskii, J.V., Tokar, V.I., and Grishenko, T.A., Phys. Rev. B 44 (1991) p. 4647.CrossRefGoogle Scholar
28.Moss, S.C., Robertson, J.L., Neumann, D.A., and Reinhard, L., Comput. Mater. Sci. 8 (1997) p. 33.CrossRefGoogle Scholar
29.Cook, H.E., J. Phys. Chem. Solids 30 (1969) p. 1097.CrossRefGoogle Scholar
30.Moss, S.C. and Reichert, H., in Local Structure from Diffraction—Fundamental Materials Science Research Series, edited by Thorpe, M.F. and Billinge, S. (Plenum Publishers, New York, 1998) p. 189.Google Scholar
31.Borie, B. and Sparks, C.J., Acta Crystallogr. 17 (1964) p. 827.CrossRefGoogle Scholar
32.Scattergood, R.O., Moss, S.C., and Bever, M.B., Acta Metall. 18 (1970) p. 1087.CrossRefGoogle Scholar
33.Moss, S.C., Acta Metall. 15 (1967) p. 1815.CrossRefGoogle Scholar
34.Keating, D.T. and Goland, A.N., Acta Metall. 15 (1967) p. 1805.CrossRefGoogle Scholar
35.Jiang, X., Wochner, P., Moss, S.C., and Zschack, P., Phys. Rev. Lett. 67 (1991) p. 2167.CrossRefGoogle Scholar
36.Shapiro, S.M., Larese, J.Z., Noda, Y., Moss, S.C., and Tanner, L.E., Phys. Rev. Lett. 57 (1986) p. 3199.CrossRefGoogle Scholar
37.Trenkler, J., Chow, P.C., Wochner, P., Abe, H., Bassler, K.E., Paniago, R., Reichert, H., Scarfe, D., Metzger, T.H., Peisl, J., Bai, J., and Moss, S.C., Phys. Rev. Lett. 81 (1998) p. 2276;CrossRefGoogle Scholar
Trenkler, J., Abe, H., Wochner, P., Haeffner, D., Bai, J., Carstanjen, H.D., and Moss, S.C., Modell. Simul. Mater. Sci. Eng. 8 (2000) p. 269;CrossRefGoogle Scholar
Trenkler, J., Moss, S.C., Reichert, H., Paniago, R., Gebhardt, U., Carstanjen, H.D., Metzger, T.H., and Peisl, J., in Exploration of Subsurface Phenomena by Particle Scattering, edited by Vandenberg, L., Lam, N.Q., Melendres, C.A., and Sinha, S.K. (IASI Press, Science & Technology Series, 2000) p. 155.Google Scholar
38.Schönfeld, B., Moss, S.C., and Kjaer, K., Phys. Rev. B 36 (1987) p. 5466.CrossRefGoogle Scholar
39.Trenkler, J., “X-Ray Study of the Critical Behavior of V2H Near the β1–β2 Phase Transition in a Defective Near-Surface Volume and in the Bulk,” PhD dissertation, University of Houston, 1999.Google Scholar
40.Trenkler, J., Barabash, R., Dosch, H., and Moss, S.C., Phys. Rev. B 64 214101 (2001).CrossRefGoogle Scholar
41.Robertson, J.L., Moss, S.C., and Kreider, K.G., Phys. Rev. Lett. 60 (1988) p. 2062.CrossRefGoogle Scholar
42.Moss, S.C. and Price, D.L., in Physics of Disordered Materials, edited by Adler, D., Fritzsche, H., and Ovshinsky, S.R. (Plenum Publishers, New York, 1985) p. 77.CrossRefGoogle Scholar
43.Nelson, D.R. and Spaepen, F., in Solid State Physics, Vol. 42, edited by Ehrenreich, H. and Turnbull, D. (Academic Press, New York, 1989) p. 1.Google Scholar
44.Robertson, J.L. and Moss, S.C., Z. Phys. B: Condens. Matter 83 (1991) p. 391; Phys. Rev. Lett. 66 (1991) p. 353.CrossRefGoogle Scholar
45.Chen, L.C., Spaepen, F., Robertson, J.L., Moss, S.C., and Hiraga, K., J. Mater. Res. 5 (1990) p. 1871.CrossRefGoogle Scholar
46.Reichert, H., Klein, O., Dosch, H., Denk, M., Honkimäki, V., Lippmann, T., and Reiter, G., Nature 409 (2000) p. 839.CrossRefGoogle Scholar
47.Shoemaker, D.P. and Shoemaker, C.B., in Introduction to Quasicrystals, Vol. 1, edited by Jaric, M.R. (Academic Press, New York, 1988) p. 1.CrossRefGoogle Scholar
48.Donner, W., Castro-Colin, M., Moss, S.C., Islam, Z., Sinha, S.K., and Nemanich, R. (unpublished).Google Scholar