Hostname: page-component-7b7567c8c-tnzcf Total loading time: 0 Render date: 2026-11-12T08:14:16.014Z Has data issue: false hasContentIssue false
  • English
  • Français

Acoustic Microscopy for Imaging and Characterization

Published online by Cambridge University Press:  29 November 2013

Andrew Briggs and
Oleg Kolosov
Get access

Extract

Acoustic microscopy is useful for characterizing with high spatial resolution the elastic structure and properties of an object. A range of techniques is now available for doing this, which enables the user to select the method and instrument that is most appropriate for a particular requirement. For imaging the interior of structures such as electronic-component packaging, an acoustic microscope operating at a relatively modest frequency can provide advanced nondestructive testing. For characterizing surface coatings and layers that may be only a fraction of a micrometer thick, higher frequency quantitative techniques are needed. For a given application, three questions should be asked at the outset: (1) What depth of material do I wish to include in my inspection? (2) Do I wish to image structures and/or defects, or do I wish to characterize elastic properties? (3) What is the minimum size of a defect or inhomogeneity that I wish to resolve or characterize (at a given depth) during my inspection? Selection of the appropriate technique will depend on the answers.

Information

Type
Ultrasonic Nondestructive Techniques for Materials Characterization
Information
MRS Bulletin , Volume 21 , Issue 10 , October 1996, pp. 30 - 35
Copyright
Copyright © Materials Research Society 1996

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Briggs, G.A.D., Acoustic Microscopy (Clarendon Press, Oxford, 1992).Google Scholar
2. SAM 100, Krämer Scientific Instruments GmbH, Lerchenweg 16–18, Postfach 35729, Herbom 35745, Germany.Google Scholar
3.Pfannschmidt, G., “Characterization of Electronic Components by Acoustic Microscopy,” in Advances in Acoustic Microscopy 2, edited by Briggs, G.A.D. and Arnold, W. (Plenum Press, New York) in press.Google Scholar
4.Crean, G.M., Flannery, C.M., and Mathuna, S.C.O., “Acoustic Microscopy Analysis of Microelectronic Interconnection and Packaging Technologies,” in Advances in Acoustic Microscopy 1, edited by Briggs, G.A.D. (Plenum Press, New York, 1995).Google Scholar
5.Crossen, J.D., Sykes, J.M., Knauss, D., Briggs, G.A.D., and Lomas, J.P., “The Influence of Water on the Coating-Material Interface: Adhesion Measurements and Scanning Acoustic Microscopy,” in Advances in Corrosion Protection by Organic Coatings II, edited by Scantlebury, J.D. and Kendig, M. (The Electrochemical Society, 1994) p. 274.Google Scholar
6.Knauss, D., Zhai, T., Briggs, G.A.D., and Martin, J.W., “Measuring Short Cracks by Time-Resolved Acoustic Microscopy,” in Advances in Acoustic Microscopy 1, edited by Briggs, G.A.D. (Plenum Press, New York, 1995) p. 49.CrossRefGoogle Scholar
7.Lawrence, C.W., Briggs, G.A.D., and Scruby, C.B., “Acoustic Microscopy of Ceramic-Fibre Composites: Part II, Glass-Ceramic-Matrix Composites,” J. Mater. Sci. 28 (1993) p. 3645.CrossRefGoogle Scholar
8.Achenbach, J.D., Kim, J.O., and Lee, Y-C., “Measuring Thin-Film Elastic Constants by Line-Focus Acoustic Microscopy,” in Advances in Acoustic Microscopy I, edited by Briggs, G.A.D. (Plenum Press, New York, 1995) p. 153.CrossRefGoogle Scholar
9.Sklar, Z., Mutti, P., Stoodley, N.C., and Briggs, G.A.D., “Measuring the Elastic Properties of Stressed Materials by Quantitative Acoustic Microscopy,” in Advances in Acoustic Microscopy I, edited by Briggs, G.A.D. (Plenum Press, New York, 1995) p. 153 p. 209.Google Scholar
10.Kushibiki, J., Ishiji, H., Kobayashi, T., Chubachi, N., Sahashi, I., and Sasamata, T., “Characterization of 36°-YX LiTaO3 Wafers by Line-Focus-Beam Acoustic Microscopy,” IEEE Trans Ultrasonics Ferroelectrics Frequency Control 42 (1995) p. 83.CrossRefGoogle Scholar
11.Warren, P.D., Pecorari, C., Kolosov, O.V., Roberts, S.G., and Briggs, G.A.D., “Characterisation of Surface Damage Via Surface Acoustic Waves,” in Nanotechnology in press.Google Scholar
12.Mutti, P., Bottani, C.E., Ghislotti, G., Beghi, M., Briggs, G.A.D., and Sandercock, J.R., “Surface Brillouin Scattering—Extending Surface Wave Measurements to 20 GHz,” in Advances in Acoustic Microscopy I, edited by Briggs, G.A.D. (Plenum Press, New York, 1995) p. 249.CrossRefGoogle Scholar
13. BriSc, Bede Scientific Instruments Ltd., Lindsey Park, Bowburn, Durham DH6 5PF, UK; http://www.bede.co.uk.Google Scholar
14.Warren, P.D., Pecorari, C., Kolosov, O.V., Roberts, S.G., and Briggs, G.A.D., “Characterisation of Surface Damage Via Contact Probes,” in Nanotechnology in press.Google Scholar
15.Kolosov, O., Arnold, W., Yamanaka, K., and Briggs, G.A.D., “Nanoscale Imaging of Dynamic Mechanical Properties by Ultrasonic Force Microscopy,” in Acoustical Imaging, vol. 22, edited by Tortoli, P. (Plenum Press, New York) in press.Google Scholar
16.Kolosov, O., Yamanaka, K., Ogiso, H., and Tokumoto, H., “Elastic Imaging With Nanoscale and Atomic Resolution by Ultrasonic Force Microscopy (UFM)” in Nanostructures and Quantum Effects (Springer-Verlag, 1994) p. 349.Google Scholar
17.Yamanaka, K., “New Approaches in Acoustic Microscopy for Noncontact Measurement and Ultra High Resolution,” in Advances in Acoustic Microscopy I, edited by Briggs, G.A.D. (Plenum Press, New York, 1995) p. 301.CrossRefGoogle Scholar
18.Kolosov, O. and Yamanaka, K., “Nonlinear Detection of Ultrasonic Vibrations in an Atomic Force Microscope,” in Jpn. J. Appl. Phys. Lett. 32 (1993) p. L1095.CrossRefGoogle Scholar
19.Kolosov, O.V., Yamanaka, K., Watanabe, K., Sakai, F., and Yasutake, M., “Ultrasonic Atomic Force Microscope,” Japan Patent Application, F1909,5-133878, priority 11.05.93.Google Scholar