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Designing defect spins for wafer-scale quantum technologies

Published online by Cambridge University Press:  27 November 2015

William F. Koehl
Affiliation:
Institute for Molecular Engineering, The University of Chicago, USA; and Argonne National Laboratory, USA; koehl@uchicago.edu
Hosung Seo
Affiliation:
Institute for Molecular Engineering, The University of Chicago, USA; hseo@uchicago.edu
Giulia Galli
Affiliation:
Institute for Molecular Engineering, The University of Chicago, USA; and Argonne National Laboratory, USA; gagalli@uchicago.edu
David D. Awschalom
Affiliation:
Institute for Molecular Engineering, The University of Chicago, USA; and Argonne National Laboratory, USA; awsch@uchicago.edu

Abstract

The past decade has seen remarkable progress in the development of the nitrogen-vacancy (NV) defect center in diamond, which is one of the leading candidates for quantum information technologies. The success of the NV center as a solid-state qubit has stimulated an active search for similar defect spins in other technologically important and mature semiconductors, such as silicon carbide. If successfully combined with the advanced microfabrication techniques available to such materials, coherent quantum control of defect spins could potentially lead to semiconductor-based, wafer-scale quantum technologies that make use of exotic quantum mechanical phenomena like entanglement. In this article, we describe the robust spin property of the NV center and the current status of NV center research for quantum information technologies. We then outline first-principles computational modeling techniques based on density functional theory to efficiently search for potential spin defects in nondiamond hosts suitable for quantum information applications. The combination of computational modeling and experimentation has proven invaluable in this area, and we describe the successful interplay between theory and experiment achieved with the divacancy spin qubit in silicon carbide.

Information

Type
Research Article
Copyright
Copyright © Materials Research Society 2015 
Figure 0

Figure 1. (a) Simplified schematic of the diamond nitrogen-vacancy center optical polarization cycle. A spin-conserving optical excitation exists between the ground (3A2) and excited (3E) state triplets. A nonradiative decay path between the mS = ±1 spin sublevels of the excited state to the metastable spin singlet (1A1) polarizes the defect into the mS = 0 sublevel of the ground state. (b) Comparison between typical sizes of an electronic-grade diamond substrate (shown in tweezers) and SiC substrate (six-inch-diameter wafer in the background). (a) Reproduced with permission from Reference 2. © 2010 National Academy of Sciences.

Figure 1

Figure 2. (a) 4a × 4a × 4a diamond supercell with the nitrogen-vacancy (NV) center in the middle. The spin density of the mS = +1 sublevel of the 3A2 ground state is indicated with the yellow lobes. (b) Defect level diagram of the NV center in diamond. The lowest-energy a1 states are in resonance with the valence band (VB). The spin-conserving interdefect optical transition from the 3A2 ground state to the 3E excited triplet is denoted by the blue dotted arrow in the spin-down channel. Note: CB, conduction band. (c) Low-spin and high-spin configurations in a two-level system.

Figure 2

Figure 3. Multiple distinct forms of divacancy defects exist in SiC because of its multiple crystal polytypes. (a) Photoluminescence data demonstrate that each defect form exhibits its own unique optical excitation energy. The 4H, 6H, and 3C polytypes of SiC have four, six, and one unique forms, respectively, of the divacancy. PL1–PL4 and QL1–QL6 are labels used to identify the zero-phonon line optical transitions of these unique defect forms. (Identities of the defects associated with PL5 and PL6 in the top panel are currently unknown.) (b) Optically detected magnetic resonance (ODMR) data of divacancy ensembles in 4H-SiC. (Bottom) ODMR data at zero magnetic field (B). (Top) ODMR as a function of magnetic field applied along the crystal’s c-axis. Each defect form has its own unique magnetic resonance frequencies. ΔIPL/IPL is the change in defect photoluminescence when microwaves of given frequency are applied, divided by the total luminescence measured without any applied microwave signal. (c) Schematic illustrating how the stacking order of the crystal planes in 4H-SiC allows for four distinct forms of the divacancy. (d–e) Spins can be modulated by many external stimuli, including (d) strain and (e) electric field. ΔI/ΔIHahn corresponds to the accumulated phase of spins during a Hahn echo sequence in which the strain or electric field is applied. In (d), Vpiezo is the voltage applied to a piezo used to strain the sample. In (e), Vmem is the magnitude of a voltage pulse applied across a thin SiC membrane of width w. The pulse width, tpulse, is held constant as Vmem is increased. (a–b) Reproduced with permission from Reference 109. © 2013 Nature Publishing Group. (c) Reproduced with permission from Reference 113. © 2015 Nature Publishing Group. (d–e) Reproduced with permission from Reference 111. © 2014 American Physical Society.

Figure 3

Figure 4. (a) Two-dimensional spatial scan of defect photoluminescence (PL) at the surface of a 4H-SiC sample. Light spots correspond to single or low numbers of defects. Circled spot in the center of the scan is a single divacancy of the (hh) type. The axis of this defect is aligned perpendicular to the page. (b) Rabi oscillations demonstrating quantum coherent control of single divacancy spins in 4H-SiC. Each panel shows data taken on a single isolated spin. Three of the four distinct defect forms are shown: (hh), (kk), and (kh). Reproduced with permission from Reference 113. © 2015 Nature Publishing Group.