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Electron-beam-driven chemical processes during liquid phase transmission electron microscopy

Published online by Cambridge University Press:  10 September 2020

Taylor J. Woehl ,
Trevor Moser ,
James E. Evans  and
Frances M. Ross
Taylor J. Woehl
Affiliation:
Department of Chemical and Biomolecular Engineering, University of Maryland, College Park, USA; tjwoehl@umd.edu
Trevor Moser
Affiliation:
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, USA; trevor.moser@pnnl.gov
James E. Evans
Affiliation:
Environmental Molecular Sciences Laboratory, Pacific Northwest National Laboratory, USA; james.evans@pnnl.gov
Frances M. Ross
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, USA; fmross@mit.edu
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Abstract

Liquid phase (or liquid cell) transmission electron microscopy (LP-TEM) has been established as a powerful tool for observing dynamic processes in liquids at nanometer to atomic length scales. However, the simple act of observation using electrons irreversibly alters the nature of the sample. A clear understanding of electron-beam-driven processes during LP-TEM is required to interpret in situ observations and utilize the electron beam as a stimulus to drive nanoscale dynamic processes. In this article, we discuss recent advances toward understanding, quantifying, mitigating, and harnessing electron-beam-driven chemical processes occurring during LP-TEM. We highlight progress in several research areas, including modeling electron-beam-induced radiolysis near interfaces, electron-beam-induced nanocrystal formation, and radiation damage of soft materials and biomolecules.

Information

Type
Liquid Phase Electron Microscopy
Information
MRS Bulletin , Volume 45 , Issue 9: Liquid Phase Electron Microscopy , September 2020 , pp. 746 - 753
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Copyright
Copyright © Materials Research Society 2020

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