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High-Resolution Three-Dimensional X-Ray Microscopy
Published online by Cambridge University Press: 31 January 2011
Abstract
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This issue of MRS Bulletin focuses on the rapid progress that is ongoing in the development of hard x-ray microscopies with three-dimensional spatial resolutions ranging from micrometers to nanometers. The individual articles provide a crosscut of developments in hard x-ray projection tomography microscopy for imaging density and chemical fluctuations in crystalline and noncrystalline materials; large-angle diffractionbased, spatially resolved imaging of local structure, orientation, and strain distributions in crystalline materials; and emerging coherent diffraction imaging for nanometer-range Fourier transform imaging of crystalline and noncrystalline materials.
Information
- Type
- Research Article
- Information
- MRS Bulletin , Volume 29 , Issue 3: High-Resolution Three-Dimensional X-Ray Microscopy , March 2004 , pp. 152 - 156
- Copyright
- Copyright © Materials Research Society 2004
References
4Marchesini, A., Chapman, H.N., Hau-Riege, S.P., London, R.A., Scoke, A., He, M., Howells, M.R., Padmore, H., Rosen, R., Spence, J.C.H., and Weierstall, U., Opt. Express 11 (2003) p. 2344.CrossRefGoogle Scholar
5Zuo, J. M., Vartanyants, I., Gao, M., Zhang, R., and Nagahara, L. A., Science 300 (2003) p. 1419.CrossRefGoogle Scholar
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