Nabil D. Bassim
Guest Editor for this issue of MRS Bulletin
U.S. Naval Research Laboratory, Washington, DC, USA; email nabil.bassim@nrl.navy.mil.
Bassim has been a materials research engineer at the Naval Research Laboratory in the Materials Science and Technology Division since 2007. He graduated from the University of Florida with a PhD degree in materials science and engineering in 2002, and joined NRL as a postdoctoral fellow from 2003–2006 with a focus on electron and ion microscopy of thin films, followed by a second postdoctoral fellowship at NIST from 2006–2007. His research interests include quantitative electron and ion-beam microscopy of various materials systems, including electronic materials, optical materials, 2D materials, naturally occurring systems such as minerals and meteorites, and nano-bio assemblages.
Keana Scott
Guest Editor for this issue of MRS Bulletin
National Institute of Standards and Technology, Materials Measurement Science Division, Gaithersburg, MD, USA; tel. 301-975-4579; and email keana.scott@nist.gov.
Scott is a physical scientist in the Materials Measurement Science Division at the National Institute of Standards and Technology (NIST). She earned her BS degree in engineering and applied sciences from the California Institute of Technology, a PhD degree in mechanical engineering from the University of Pittsburgh, and a MS degree in biotechnology from the Johns Hopkins University. Prior to joining NIST in 2006, she spent several years developing automation engineering solutions for Celera Genomics and led a group of scientists involved in computational chemistry and proteomics. Her current research efforts include multi-modal 3D imaging technique development and microanalysis of complex materials using electron and ion beams.
Lucille A. Giannuzzi
Guest Editor for this issue of MRS Bulletin
L.A. Giannuzzi & Associates LLC and EXpressLO LLC, Fort Myers, FL, USA; email lucille@lagiannuzzi.com.
Giannuzzi is president of both L.A. Giannuzzi & Associates LLC and EXpressLO LLC. She received her BE and MS degrees from SUNY Stony Brook and her PhD degree from The Pennsylvania State University. Giannuzzi spent 10 years with the University of Central Florida, then spent seven years with FEI Company before opening her own consulting and ex situ lift-out product companies. Her research interests include ion- and electron-solid interactions, grain-boundary diffusion and segregation, structure property relationships of materials using ion and electron-beam microscopy, and product development. She has received an NSF CAREER Award, is a Fellow of AVS, and is a member of numerous societies, including MRS. Giannuzzi has authored more than 100 publications and is co-editor of the book Introduction to Focused Ion Beams.
Nicholas Antoniou
Center for Nanoscale Systems, Harvard University, Cambridge, MA, USA; tel. 617-496-9682; and email nicholas@cns.fas.harvard.edu.
Antoniou is the principal FIB engineer at the Center for Nanoscale Systems at Harvard University. He received his BSc and MSc degrees in electrical engineering from Texas A&M University, College Station, TX. He has over 25 years of work experience in the electronics field, having worked in semiconductor fabrication facilities for Motorola Inc., microprocessor product engineering at Ross Technology, and for FIB product management at Micrion, at which time Micrion was acquired by FEI Company. He also worked for Credence in their diagnostic and characterization division and started CIET, a nanotechnology IP company.
Marco Cantoni
Materials and Basic Science, Swiss Federal Institute of Technology EPFL, Lausanne, Switzerland; email marco.cantoni@epfl.ch.
Cantoni is the EM facility manager for materials and basic science at the Swiss Federal Institute of Technology EPFL in Lausanne. He received his PhD degree in experimental physics in the department of solid-state physics at ETH Zurich in 1994. After a stay as a STA (science and technology agency) Fellow in Japan, he joined the electron microscopy center at EPFL in Lausanne. He has studied a wide variety of materials by electron microscopy. In recent years, he has established focused ion beam nano-tomography for materials and life science at EPFL, with a strong focus on high throughput and the use of multiple detectors.
Lorenz Holzer
Institute of Computational Physics, Zurich University of Applied Sciences, Winterthur, Switzerland; email lorenz.holzer@zhaw.ch.
Holzer is a senior scientist at the Institute of Computational Physics in Zurich University of Applied Sciences (ZHAW). His research is focused on microstructure effects related to materials science applications, such as electrodes of solid oxide fuel cells or porous membranes. He received a PhD degree in earth science from the University of Bern (Switzerland) in 1997. Afterward, he worked at the Federal Institute for Materials Testing and Research (Empa Dübendorf, Switzerland). Since 2011, his research at ZHAW has focused on the link between microstructure analysis and computational modeling related to transport phenomena in porous materials, electrochemical devices, and sensor applications.
David C. Joy
Department of Biochemistry, Cellular and Molecular Biology and Department of Materials Science and Engineering, University of Tennessee, USA; email djoy@utk.edu.
Joy is a professor in the Department of Biochemistry, Cellular and Molecular Biology and the Department of Materials Science and Engineering at the University of Tennessee. He earned his MA degree in the natural sciences from Trinity College, Cambridge (UK) in 1966 and his DPhil degree in materials science from the University of Oxford (UK) in 1969. He is a Fellow of both the Royal Microscopical Society (London, UK) and the Microscopy Society of America. Joy has authored or co-authored nine books and over 400 technical papers. His areas of interest include ion-beam microscopy and microanalysis, techniques to quantify the imaging performance of electron and ion microscopes, and Monte Carlo modeling of electron and ion interactions with solids, liquids, and gases.
Paul G. Kotula
Sandia National Laboratories, Albuquerque, NM, USA; email paul.kotula@sandia.gov.
Kotula is a staff member at Sandia National Laboratories in Albuquerque, NM. He received his BS degree from Cornell University in 1991 and his PhD degree from the University of Minnesota in 1995, both in materials science and engineering. He has authored or co-authored over 100 journal articles on a wide variety of topics involving electron microscopy and microanalysis in the physical and biological sciences, as well as three patents and three book chapters. He has received an R&D 100 Award, two Best Analytical Techniques paper awards in Microscopy and Microanalysis, and the Heinrich Award for Outstanding Young Scientist from the Microanalysis Society.
Diederik Maas
TNO, Delft, The Netherlands; tel. +31-888-666-524; and email diederik.maas@tno.nl.
Maas joined TNO in 2007 as a systems engineer for metrology and detection, focusing on developing instrumentation, processes, and applications for sub-20 nm nanofabrication and extreme imaging. He has a MSc degree in technical physics (Delft, 1993) and a PhD degree (UvA, AMOLF, 1998). At Philips Research Eindhoven, he developed an electrostatic aberration corrector for FEI’s low-voltage SEM. In 2005, this corrector showed contrast and resolution improvement down to 500 V beam energy.
Michael P. Marsh
Marsh Imaging and Visualization, Denver, CO, USA; email mike@marshimaging.com.
Marsh is the chief scientist of Marsh Imaging and Visualization. He earned his BS degree in chemistry from Centenary College in 1998 and his PhD degree in structural and computational biology and molecular biophysics from Baylor College of Medicine in 2007. His research interests focus on maximizing the revelations of x-ray imaging and electron microscopy experiments.
Joseph Michael
Sandia National Laboratories, Albuquerque, NM, USA; email jrmicha@sandia.gov.
Michael is a senior scientist in the Materials Science Center at Sandia National Laboratories. He received his BS, MS, and PhD degrees in materials science and engineering from Lehigh University. Before joining Sandia, Michael was employed as a senior research engineer at Bethlehem Steel’s Homer Research Laboratory. Recently, Michael has been involved in the use of focused ion beams for the preparation of samples for 3D structure of materials. He has received the Burton Medal from the Microscopy Society of America and the Heinrich and Duncumb Award for Excellence in Microanalysis from the Microanalysis Society. Michael has published many papers on the applications of electron and ion microscopy. His research interests involve the application of advanced scanning ion and electron microscopies to the study of materials.
John Notte
Carl Zeiss Microscopy, LLC, Thornwood, NY, USA; email john.notte@zeiss.com.
Notte is the director of research and development at the Ion Microscopy Innovation Center at Carl Zeiss Microscopy, LLC. He received his PhD degree in physics from the University of California, Berkeley, where he developed an electron plasma trap and integrated imaging system. He worked for several SEM/FIB companies before joining ALIS, the startup company that introduced the first commercial helium ion microscope. Within Zeiss, Notte’s chief concerns are extending the capabilities of the gas field ion source and other technologies that support its imaging capabilities.
Leonidas Ocola
Center for Nanoscale Materials, Argonne National Laboratory, USA; tel. 630-252-6613; and email ocola@anl.gov.
Ocola is a staff scientist at the Center for Nanoscale Materials at Argonne National Laboratory. He received his BSc degree (1989) from the Universidad Nacional de Ingeniería (Lima, Peru), and his MSc (1991) and PhD (1996) degrees from the University of Wisconsin–Madison in physics. He has published over 110 papers and one book and holds two patents. He is involved in nanofabrication research, electron beam, and direct-write ion-beam lithography.
Gregory S. Rohrer
Carnegie Mellon University, Pittsburgh, PA, USA; email gr20@andrew.cmu.edu.
Rohrer is the W.W. Mullins Professor of Materials Science and Engineering and the head of the Materials Science and Engineering Department at Carnegie Mellon University. He received his bachelor’s degree in physics from Franklin and Marshall College in 1984 and his PhD degree in materials science and engineering from The University of Pennsylvania in 1989. He has authored more than 210 research publications, mostly on topics related to surfaces, grain boundaries, and interfaces.
Chad Rue
FEI Company, Hillsboro, OR, USA; email: Chad.Rue@fei.com.
Rue works at FEI Company in Hillsboro, OR, where he has been responsible for FIB process and chemistry development since 2005. He received his BS degree in chemistry (1994) from Boise State University and his PhD degree in physical chemistry (2000) from the University of Utah. From 2000–2005, he worked for IBM in Fishkill, NY, where he was involved in technique development for circuit edit applications.
Konrad Rykaczewski
Arizona State University, Phoenix, AZ, USA; tel. 480-727-2050; and email konradr@asu.edu.
Rykaczewski is an assistant professor at the School for Engineering of Matter, Transport and Energy at Arizona State University. He received his BS (2005), MS (2007), and PhD (2009) degrees in mechanical engineering from the Georgia Institute of Technology. Prior to his appointment at ASU, he was a research scientist at the Massachusetts Institute of Technology and an NRC postdoctoral fellow at the National Institute of Standards and Technology. His current research interests include fundamental studies of nano/microscale thermofluidic and interfacial phenomena, novel in situ and cryogenic electron and ion-beam microscopy methods, and nanoengineering of functional surfaces with special wettability for a variety of applications.
Noel Smith
Oregon Physics LLC, Hillsboro, OR, USA; email n.smith@oregon-physics.com.
Smith is a co-founder and scientist at Oregon Physics LLC. He received his PhD degree in physics from Warwick University in the UK, where he developed a low-energy focused ion beam for high depth resolution SIMS analysis. He has developed ion/electron optics and ion sources for a number of FIB and surface science instrument development companies before co-founding Oregon Physics in 2007. Smith’s interests focus on the further development of ion sources and probe forming optics.
Adam V. Steele
zeroK Nanotech Corporation, Montgomery Village, MD, USA; email adam@zerok.com.
Steele is a co-founder of zeroK Nanotech Corporation, a startup company focused on the commercialization of high-brightness ion sources that utilize laser-cooling. He received his PhD degree in physics from the Georgia Institute of Technology, where he researched laser-cooling of ions with application to nuclear clocks and quantum information processing. Prior to founding zeroK, Steele worked at the National Institute of Standards and Technology on a proof-of-concept retrofit of a low-temperature ion source with a commercial focused ion beam system.
Michael D. Uchic
Air Force Research Laboratory, Materials & Manufacturing Directorate, Wright-Patterson Air Force Base, OH, USA; tel. 937-255-0594; and email michael.uchic@us.af.mil.
Uchic is a senior materials engineer at the Materials Directorate of the Air Force Research Laboratory. He graduated from Stanford University with a PhD degree in materials science and engineering and joined the metals branch in 1998. His research efforts have focused on the development of new experimental methods to rapidly assess both the microstructure and mechanical properties of aerospace alloys.
