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In situ thermomechanical testing for micro/nanomaterials

Published online by Cambridge University Press:  12 August 2011

Wonmo Kang and
M. Taher A. Saif
Wonmo Kang
Affiliation:
Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, 1206 West Green Street, Urbana, Illinois 61801
M. Taher A. Saif*
Affiliation:
Department of Mechanical Science and Engineering, University of Illinois at Urbana-Champaign, 1206 West Green Street, Urbana, Illinois 61801
*
Address all correspondence to M. Taher A. Saif at saif@illinois.edu
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Abstract

A novel method for the in situ thermomechanical test of micro/nanoscale samples at high temperature is presented. During the in situ test, the stage is resistively heated while the temperature is measured by a cofabricated temperature sensor. For experimental demonstration of the thermomechanical testing method, we fabricate the Micro-Electro-Mechanical Systems (MEMS) stage using silicon carbide (SiC) and carry out in situ uniaxial tests for single-crystal silicon (SCS) microsamples at temperatures from room temperature to 400 °C. We recover the known elastic modulus of SCS within 1% error in this temperature range.

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Type
Rapid Communications
Information
MRS Communications , Volume 1 , Issue 1 , November 2011, pp. 13 - 16
Copyright
Copyright © Materials Research Society 2011

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