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δ2-Y2Si2O7 Structure Confirmed by Processing and Simulation of Atomic-Resolution Images

Published online by Cambridge University Press:  21 February 2011

R.S. Rai,
M.A. O'keefe and
G. Thomas
R.S. Rai
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
M.A. O'keefe
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
G. Thomas
Affiliation:
National Center for Electron Microscopy, Lawrence Berkeley Laboratory, University of California, Berkeley, CA 94720.
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Abstract

High resolution electron micrographs have been obtained in various orientations for δ2-Y2Si2O7 using the Atomic Resolution Microscope (ARM) at the National Center for Electron Microscopy (NCEM). These ARM images were processed by masking the diffractogram of the digitized image in Fourier space and applying an inverse transform (using the SEMPER program at the NCEM Image Analysis Facility) in order to reveal details obscured by amorphous contrast originating in the glassy matrix. Processed experimental images from very thin regions of the crystalline phase were compared with images simulated from postulated models (SHRLI images); close agreement was obtained.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 139: Symposium R – High Resolution Microscopy of Materials , 1989, 175
Copyright
Copyright © Materials Research Society 1989

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References

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