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Analysis of Domain-Size Distributions in Epitaxial Growth Using Leed Angular Profiles

Published online by Cambridge University Press:  25 February 2011

D. Saloner and
M. G. Lagally
D. Saloner
Affiliation:
Department of Metallurgical and Mineral Engineering and Materials Science Center, University of Wisconsin-Madison, WI 53706
M. G. Lagally
Affiliation:
Department of Metallurgical and Mineral Engineering and Materials Science Center, University of Wisconsin-Madison, WI 53706
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Abstract

Angular profiles of diffracted beams in surface-sensitive diffraction techniques can be used to establish the degree of order at the surface of crystals. Results are presented showing the sensitivity of such profiles to the growth mode of overlayer islands. A method is presented to incorporate the two-dimensional nature of the problem into the analysis and to extract finite-size effects from fundamental and superlattice beams.

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References

1. Ludeke, R., J. Vac. Sci. Technol. B 2, 400 (1984).10.1116/1.582833Google Scholar
2. Dash, J. G., Films on Solid Surfaces, (Academic Press, New York 1975); References in; Ordering in Two Dimensions, edited by S. K. Sinha (Elsevier-North Holland, Amsterdam 1980).Google Scholar
3. Henzler, M., Surface Sci. 73, 240 (1978); M. Henzler in: Electron Spectroscopy for Surface AnaFysis, edited by H. Ibach, Topics in Current Physics, Vol.4 (Springer, Berlin, 1977).10.1016/0039-6028(78)90499-5Google Scholar
4. Lagally, M. G. in: Chemistry and Physics of Solid Surfaces, vol. IV, edited by Vanselow, R. and Howe, R. (Springer, Heidelberg, 1982).Google Scholar
5. Lagally, M. G., Lu, T.-M., and Wang, G.-C., in: Ordering in Two Dimensions, edited by Sinha, S. K. (Elsevier-North Holland, Amsterdam 1980).Google Scholar
6. Saloner, D. and Lagally, M. G., in: Proceedings of the International Conference on the Structure of Surfaces, Berkeley, 1984 (in press).Google Scholar
7. Granqvist, C. G. and Buhrmann, R. A., Appl. Phys. Lett. 27, 693 (1975).10.1063/1.88342Google Scholar
8. Smoluchowski, M. V., Phys. Z. 17, 557 (1916).Google Scholar
9. Lu, T.-W. and Lagally, M. G., Surface Sci. 120, 47 (1982).10.1016/0039-6028(82)90274-6CrossRefGoogle Scholar
10. Wynblatt, P. and Gjostein, N. A., Prog. S. S. Chem. 9, 21 (1975).10.1016/0079-6786(75)90013-8Google Scholar
11. Saloner, D., Wu, P. K., and Lagally, M. G., J. Vac. Sci. Technol. A3 (1985) in press.Google Scholar
12. Lu, T.-M., Zhao, L.-H., Lagally, M. G., Wang, G.-C., and Houston, J. E., Surface Sci. 122, 519 (1982).10.1016/0039-6028(82)90100-5CrossRefGoogle Scholar
13. Lent, C. S. and Cohen, P. I., Surface Sci. 139, 122 (1984).10.1016/0039-6028(84)90013-XCrossRefGoogle Scholar
14. Henzler, M., Appl. Phys., (submitted).Google Scholar
15. Jagodzinski, H., Moritz, W. and Wolf, D., Surface Sci. 77, 233, 249, 265, 283, (1978); W. Moritz and D. Wolf, in Proceedings ofthe 4th Int. Conf. on Solid Surfaces and 3rd Europ. Conf. on Surf. Sci., Cannes, 1980, p. 1295.10.1016/0039-6028(78)90004-3CrossRefGoogle Scholar
16. Henzler, M., Surface Sci. 73, 240 (1978).10.1016/0039-6028(78)90499-5Google Scholar
17. Clearfield, H. M., Ph.D. dissertation, University of Wisconsin-Madison (1984) unpublished).Google Scholar