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Characterization of Single Crystal Mercuric Iodide (HgI2) Using Thick Detector Structures*

Published online by Cambridge University Press:  15 February 2011

A. Beyerle,
K. Hull,
J. Markakis,
W. Schnepple and
L. Van Den Berg
A. Beyerle
Affiliation:
EG&G, Energy Measurements Group, Santa Barbara Operations, 130 Robin Hill Road, Goleta, California 93117
K. Hull
Affiliation:
EG&G, Energy Measurements Group, Santa Barbara Operations, 130 Robin Hill Road, Goleta, California 93117
J. Markakis
Affiliation:
EG&G, Energy Measurements Group, Santa Barbara Operations, 130 Robin Hill Road, Goleta, California 93117
W. Schnepple
Affiliation:
EG&G, Energy Measurements Group, Santa Barbara Operations, 130 Robin Hill Road, Goleta, California 93117
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Abstract

Single crystal sections of HgI2 (about 1 cm thick) have been evaluated for charge carrier transport properties. Using these thick detector structures, surface effects produced during fabrication are reduced, enhancing the bulk property characteristics. The standard time-of-flight method was used to determine electron and hole mobilities. Lifetime measurements for electrons and holes were made by direct observation of the carrier decay where crystal transit times were long compared to lifetimes. Nonlinear charge carrier velocities have been observed during mobility measurements. These nonlinearities impair a partial charge collection technique [1,2,3] for spectra generation taken with thick detectors while having a lesser effect on the standard full charge collection approach. Partial charge collection methods have produced greater peak efficiencies than full charge collection, and investigations of crystal properties are being used to enhance this method.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 16: Symposium – F Nuclear Radiation Detector Materials , 1982, 191
Copyright
Copyright © Materials Research Society 1983

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Footnotes

*

This work was performed under the auspices of the U.S. Department of Energy under Contract No. DE–AC08–76NVO1183. NOTE: By acceptance of this article, the publisher and/or recipient acknowledges the U.S. Government's right to retain a nonexclusive royalty-free license in and to any copyright covering this paper.

Reference to a company or product name does not imply approval or recommendation of the product by the U.S. Department of Energy to the exclusion of others that may be suitable.

References

REFERENCES

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