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Diffraction Microscopy using 20-kV Electron Beam for Multi-Wall Carbon Nanotubes

Published online by Cambridge University Press:  01 February 2011

Osamu Kamimura,
Kota Kawahara,
Takahisa Doi,
Takashi Dobashi,
Takashi Abe and
Kazutoshi Gohara
Osamu Kamimura
Affiliation:
osamu.kamimura.ae@hitachi.com, Central Research Laboratory, Hitachi, Ltd., Advanced Technology Research Dept., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Kota Kawahara
Affiliation:
kawahara@eng.hokudai.ac.jp, Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
Takahisa Doi
Affiliation:
takahisa.doi.px@hitachi.com, Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Takashi Dobashi
Affiliation:
takashi.dobashi.kn@hitachi.com, Central Research Laboratory, Hitachi, Ltd., 1-280, Higashi-koigakubo, Kokubunji-shi, Tokyo, N/A, Japan
Takashi Abe
Affiliation:
t-abe@eng.hokudai.ac.jp, Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
Kazutoshi Gohara
Affiliation:
gohara@eng.hokudai.ac.jp, Hokkaido University, Department of Applied Physics, Sapporo, N/A, Japan
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Abstract

Diffraction microscopy (or diffractive imaging) with iterative phase retrieval was performed using a low-energy (20-keV) electron beam to verify the possibility of high-resolution imaging with low specimen damage. Diffraction patterns of fine and uniform multi-wall carbon nanotubes (MWCNT) were recorded without a post-specimen lens. One- and two-dimensional phase retrievals were processed from the diffraction pattern alone. The reconstructed object images reflected the characteristic structure of the MWCNT. These results show the possibility of high-resolution imaging with a low-energy electron beam.

Keywords

transmission electron microscopy (TEM)scanning transmission electron microscopy (STEM)scanning electron microscopy (SEM)

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References

1. Sayer, D., Acta Crystallogr. A 5, 43 (1952)Google Scholar
2. Gershberg, R. W. and Saxton, W. O., Optik 34, 275 (1971)Google Scholar
3. Fienup, J., Appl. Opt. 21, 2758 (1982)10.1364/AO.21.002758Google Scholar
4. Miao, J., Charalambous, P., Kirz, J., and Sayre, D., Nature 400, 342 (1999)10.1038/22498Google Scholar
5. Shapiro, D. et al. , Proc. Nat. Acad. Sci. USA 102, 15343 (2005)10.1073/pnas.0503305102Google Scholar
6. Chapman, H. N. et al. , Nat. Phys. 2, 839 (2006)10.1038/nphys461Google Scholar
7. Weierstall, U., Chen, Q., Spence, J. C. H., Howells, M. R., Isaacson, M., and Panepucci, R. R., Ultramicroscopy 90, 171 (2002)10.1016/S0304-3991(01)00134-6Google Scholar
8. Zuo, J. M., Vartanyants, I., Gao, M., Zhang, R., and Nagahara, L. A., Science 300, 1419 (2003)10.1126/science.1083887Google Scholar