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Electrical, Optical and Ionic Probe inside Transmission Electron Microscope

Published online by Cambridge University Press:  21 February 2013

Xuedong Bai ,
Zhi Xu ,
Peng Gao ,
Kaihui Liu ,
Wenlong Wang  and
Enge Wang
Xuedong Bai
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China ,
Zhi Xu
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China ,
Peng Gao
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China ,
Kaihui Liu
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China ,
Wenlong Wang
Affiliation:
Institute of Physics, Chinese Academy of Sciences, Beijing 100190, China ,
Enge Wang
Affiliation:
School of Physics, Peking University, Beijing 100871, China
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Abstract

In-situ transmission electron microscopy (TEM) method is powerful in a way that it can directly correlate the atomic-scale structure with physical and chemical properties. We will report on the construction and applications of the homemade in-situ TEM electrical and optical holders. Electrical transport of carbon nanotubes and photoconducting response on bending of individual ZnO nanowires have been studied inside TEM. Oxygen vacancy electromigration and its induced resistance switching effect have been probed in CeO2 films.

Keywords

transmission electron microscopy (TEM)electrical propertiesoptical properties

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 1525: Symposium SS – Quantitative In-Situ Electron Microscopy , 2013 , mrsf12-1525-ss11-02
Copyright
Copyright © Materials Research Society 2013

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References

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