Hostname: page-component-74656f9884-2dmjx Total loading time: 0 Render date: 2026-11-09T04:13:08.462Z Has data issue: false hasContentIssue false
  • English
  • Français

Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM

Published online by Cambridge University Press:  10 February 2011

J. R. Michael  and
R. P. Goehner
J. R. Michael
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-1405, jrmicha@sandia.gov
R. P. Goehner
Affiliation:
Sandia National Laboratories, Albuquerque, NM 87185-1405, jrmicha@sandia.gov
Get access

Abstract

EBSD in the SEM has been developed into a tool that can provide identification of unknown crystalline phases with a spatial resolution that is better than one micrometer. This technique has been applied to a wide range of materials. Use of the HOLZ rings in the EBSD patterns has enabled the reduced unit cell to be determined from unindexed EBSD patterns. This paper introduces EBSD for phase identification and illustrates the technique with examples from metal joining and particle analysis. Reduced unit cell determination from EBSD patterns is then discussed.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 589 , 1999 , 39
Copyright
Copyright © Materials Research Society 2001

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1.Goehner, R. P. and Michael, J. R., J. of Res. of the Nat. Institute of Standards and Technology, 101, 1996, pp. 301.Google Scholar
2.Steeds, J. W., Convergent Beam Electron Diffraction, in: Introduction to Analytical Electron Microscopy, edited by Hren, J. J., Goldstein, J. I. and Joy, D. C., (Plenum Press, New York, 1979) p. 399.Google Scholar
3.Baba-Kishi, K. Z. and Dingley, D. J., Scanning, 11,1989, p. 305.Google Scholar
4.Baba-Kishi, K. Z., Scanning, 20,1998, p. 117.Google Scholar
5.Michael, J. R., Schlienger, M. E. and Goehner, R. P., Microscopy and Microanalysis, 3 Supplement, 1997, p. 879.Google Scholar
6.Robino, C.V., Michael, J.R., Maguire, M.C., Welding Journal Research Supplement, 77, 1998, pp. 446-s–457-s.Google Scholar
7.Small, J. and Michael, J., Microscopy and Microanalysis, 5 Supplement 2, 1999, p. 226.Google Scholar
8.Michael, J. R. and Eades, J. A., Ultramicroscopy, in press.Google Scholar
9.Lepage, Y., Microscopy Research and Technique, 21, 1992, p. 158.Google Scholar