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High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers

Published online by Cambridge University Press:  15 February 2011

David A. Howell,
Martin A. Crimp,
Lilian M. Hoines and
J. Bass
David A. Howell
Affiliation:
Michigan State University, Dept. of Materials Science & Mechanics, E. Lansing, MI48824
Martin A. Crimp
Affiliation:
Michigan State University, Dept. of Materials Science & Mechanics, E. Lansing, MI48824
Lilian M. Hoines
Affiliation:
Michigan State University, Dept. of Physics & Astronomy, E. Lansing, MI 48824
J. Bass
Affiliation:
Michigan State University, Dept. of Physics & Astronomy, E. Lansing, MI 48824
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Abstract

High-resolution transmission electron microscopy has been used to investigate the structure and growth behavior of three separate multilayer systems composed of spin-glass alloys(AuFe.03,CuMn.15, and AgMn.09) alternating with amorphous silicon. Each of the three systems was fabricated with two different sample configurations. The first consisted of bilayers with 3 nm spinglass alloy and 7 nm amorphous siliconlayers. The second consisted of 7 nm spin-glass alloy and 7 nm amorphous silicon layers. HRTEM images of ion-milled cross-sectioned samples revealed variations in the degree of crystallinity of the spin-glass material. Variations in the amount and symmetry of interlayer formation were also observed. Systematic studies of such variations should help to explain differences in their measured spin-glass properties.

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References

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