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Hrem Structural Studies of TbFeCo Thin Films

Published online by Cambridge University Press:  03 September 2012

Z. G. Li,
David J. Smith and
K. Sickafus
Z. G. Li
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
David J. Smith
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, Arizona 85287
K. Sickafus
Affiliation:
General Products Division, IBM Tucson, Arizona 85744
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Abstract

The microstructure of TbFeCo thin films prepared under different deposition conditions has been observed in crosssection and top-view using high-resolution electron microscopy, as well as conventional bright-field and dark-field techniques. A comparison has been made with FeCo thin films prepared under identical experimental conditions. Very fine microcrystals (sizes 2–5nm) were observed in the basically amorphous TbFeCo thin films whereas much larger crystals (sizes 20–50nm) were visible in the primarily crystalline FeCo thin films. It was also found that the size of the nanocrystals in the TbFeCo films depended upon the argon partial pressure during deposition.

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References

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