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Image-Based Nanocrystallography in Future Aberration-Corrected Transmission Electron Microscopes

Published online by Cambridge University Press:  21 March 2011

P. Moeck,
W. Qin and
P. B. Fraundorf
P. Moeck
Affiliation:
Department of Physics, Portland State University, P.O. Box 751, Portland, OR 97207-0751, pmoeck@pdx.edu
W. Qin
Affiliation:
Motorola Technology Solutions/SPS, MD CH305, Chandler, AZ 85284
P. B. Fraundorf
Affiliation:
Department of Physics and Astronomy and Center for Molecular Electronics, University of Missouri at St. Louis, MO 53121
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Abstract

Since the crystallographic phase and morphology of many materials changes with the crystal size in the one to hundred nanometer range and the potential technological applications of nanoparticles are enormous, a need arises to determine the crystallography of nanoparticles individually. Direct space high- resolution phase-contrast transmission electron microscopy (TEM) and atomic resolution Z-contrast scanning TEM when combined with goniometry of direct and/or reciprocal lattice vectors offer the possibility of developing dedicated nanocrystallography characterization methods for such small nanoparticles. Although experimentally feasible for cubic nanocrystals with lattice constants larger than 0.4 nm in contemporary high-resolution TEMs with modest tilt range, image-based nanocrystallography by means of transmission electron goniometry has so far only been employed by a few specialists worldwide. This is likely to change in the future with the availability of aberration-corrected TEMs. The reasons why this change is likely to happen are outlined in this paper.

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