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Improved Algorithm to Extract Force-distance Curves from Scanning Force Microscope Data

Published online by Cambridge University Press:  10 February 2011

Steven J. Eppell,
Brian A. Todd and
Fredy R. Zypman
Steven J. Eppell
Affiliation:
Biomedical Engineering Department, Case Western Reserve University, Cleveland, OH
Brian A. Todd
Affiliation:
Biomedical Engineering Department, Case Western Reserve University, Cleveland, OH
Fredy R. Zypman
Affiliation:
Department of Physics and Electronics, University of Puerto Rico, Humacao, PR
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Abstract

Physically meaningful near-surface force fields are used to calculate simulated scanning force microscope cantilever deflection data. The simulated data is used to evaluate the ability of a few models to calculate forces from cantilever deflections. The conventional simple harmonic oscillator model is shown to be significantly inaccurate in converting deflections to forces. A bending beam model is developed which accurately converts deflections to forces. This model is shown to be necessary for accurate assignment of physical meaning to the calculated forces under high force gradient conditions.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 584 , 1999, 189
Copyright
Copyright © Materials Research Society 2000

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