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A Microscopic Marker Technique For Documenting Interface Motion in Corrosion Scales Using TEM

Published online by Cambridge University Press:  21 February 2011

Shou-Kong Fan and
Linn W. Hobbs
Shou-Kong Fan
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139now at Texas Instruments, Inc., P.O. Box 655621, Dallas, TX 75265
Linn W. Hobbs
Affiliation:
Department of Materials Science and Engineering, M.I.T., Cambridge, MA 02139
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Abstract

We report here on a microscopic marker technique designed for use with cross-section TEM examination of corrosion scales. The technique involves microphotolithographic methods for sputter deposition of inert markers and has been used to document substrate/scale interface motion during high-temperature oxidation of Ni and Ni-base alloys.

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References

REFERENCES

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