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Microscopic Techniques for Characterization of Magnetic Layers

Published online by Cambridge University Press:  10 February 2011

N. Meyendorf,
I. Altpeter,
U. Netzelmann,
J. Hoffmann,
W. Nichtlpecher and
H. Grimm
N. Meyendorf
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
I. Altpeter
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
U. Netzelmann
Affiliation:
Fraunhofer Institute Nondestructive Testing, University 37, 66123 Saarbruecken, Germany
J. Hoffmann
Affiliation:
Center for Materials Diagnostics, University of Dayton, Dayton OH 45469-0121
W. Nichtlpecher
Affiliation:
Exabyte Magnetics, Nuernberg, Germany
H. Grimm
Affiliation:
IBM, Mainz, Germany
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Abstract

In recent years increasing interest in magnetic materials especially amorphous and nano crystalline layers has arised. Due to the magnetostrictive and magnetoresistive properties magnetic materials obtained high importance in sensor, actuator and memory applications. Therefore new methods to characterize magnetic and mechanical properties of magnetic materials are required. Two new microscopic techniques will be presented in this paper.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 591 , 1999, 145
Copyright
Copyright © Materials Research Society 2000

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References

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