Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-14T22:47:13.390Z Has data issue: false hasContentIssue false
  • English
  • Français

A Microstructural Study of Reaction-Bonded Silicon Carbide

Published online by Cambridge University Press:  15 February 2011

K. Das Chowdhury,
R. W. Carpenter and
W. Braue
K. Das Chowdhury
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ
R. W. Carpenter
Affiliation:
Center for Solid State Science, Arizona State University, Tempe, AZ
W. Braue
Affiliation:
German Aerospace Research Establishment, D5000, Cologne, Germany
Get access

Abstract

Interfaces in Reaction Bonded Silicon Carbide (RBSC) have been characterized by Analytical and High Resolution Electron Microscopy. Both Si/SiC and SiC/SiC interfaces were free of any oxygen impurity segregation, but contained metallic impurity precipitates. Oxygen was detected in the second phase particles in the SiC grains. A model is presented to explain the evolution of these second phase particles in the SiC grains.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

[1] Ness, J. N. and Page, T. F., J. Mat. Sci., 21, 1377, (1986)CrossRefGoogle Scholar
[2] Sawyer, G. R. and Page, T. F., in Tailoring Multiphase and Composite Ceramic; Proc. of the 21st. Univ. Conf. on Ceramic Science, (Plenum Press, NY, 1986), pg. 347.Google Scholar
[3] Clarke, D. R., J. Am. Cer. Soc., 60(11–12), 539 (1977).CrossRefGoogle Scholar
[4] Scace, R. I. and Slack, G. A., J. Chem. Phys, 30(6), 1551, (1959).Google Scholar
[5] Kirkwood, D. H. and Chipman, J., J. Phys. Chem., 65, 1082, (1961).Google Scholar
[6] Nozaki, T., Yatsurugi, Y., and Akiyama, N., J. Electrochem. Soc., 117(12), 1566, (1970).CrossRefGoogle Scholar
[7] Chaim, R. and Heuer, A. H., J. Am. Cer. Soc., 74(7), 1663, (1991).CrossRefGoogle Scholar
[8] JANAF Thermochemical Data, Army-Navy-Air Force Thermochemical Panel, The Dow Chemical Co. Midland, MI, 1962–1963.Google Scholar
[9] Skiff, M., Carpenter, R. W. and Lin, S. H., J. Appl. Phys., 62, 2439, (1987).Google Scholar