Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-13T22:58:31.310Z Has data issue: false hasContentIssue false
  • English
  • Français

Nanoscale Control of Layer Thickness for EL Devices by Mass-controlled Layer-by-layer Sequential Adsorption Process

Published online by Cambridge University Press:  21 March 2011

Seimei Shiratori,
Masayoshi Yamada,
Takahiro Ito,
Tom.C. Wang and
Michael F. Rubner
Seimei Shiratori
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO University Hiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Masayoshi Yamada
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO University Hiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Takahiro Ito
Affiliation:
Dept.of Applied Physics & Physico-informatics, KEIO University Hiyoshi Kouhoku-ku Yokohama 223-8522, JAPAN
Tom.C. Wang
Affiliation:
Massachusetts Institute of Technology, Cambridge MA 02139, USA
Michael F. Rubner
Affiliation:
Massachusetts Institute of Technology, Cambridge MA 02139, USA
Get access

Abstract

A mass controlled layer-by-layer sequenitial adsorption process for polyelectlrolytes was newly developed for the fabrication of functional devices using ultra-thin organic film formed by various polymers of different polarity of charge. In this study hydrophobic Ruthenium complex monomer • tris(bipyridyl) ruthenium(II) hexafluorophosphate • was micelle-wrapped with an anionic surfactant, sodium dodecylbenzenesulfonate, and was assembled with PAH (poly (allylamine hydrochloride)), which has the opposite charge, on ITO substrates. With this method, we succeeded in fabricating ultra-thin organic films even when the adsorption material is not polymer but monomer. Moreover it was found that the film thickness of the self-assembled Ru micelle/PAH had a linear relationship with the number of bilayers. By using this process, an EL device was fabricated by depositing the thin film of micelle-wrapping ruthenium complex monomer on ITO and metal electrode on top of the film. Light emission was observed by applying voltage to this device.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1) Decher., G, Hong., J.D. and Schmit, J., Thin Solid Films,210/211,831(1992).Google Scholar
2) Yoo, Dongsik, Shiratori, Seimei S., and Rubner, Michael F., Macromolecules 31, 4309–4318, 1998.Google Scholar
3) Fou, A.C., Onitsuka, O., Ferreira, M., and Rubner, M.F., J.Appl.Phys. 79. (10). 15 May. 1996.Google Scholar
4) Yamada, Masayoshi and Sha, Seimei Shiratori, The 10th International Conference on Solid-State Sensors and Actuators, Transducer 99, Digest of technical papers. p.1880-1881, June.1999. Accepted for publication in Sensors & Actuators 2000.Google Scholar
5) Shiratori, Seimei S., Inami, Yuji, Kikuchi, Masashi, Yamada, Takeshi and Yamada, Masayoshi, The 5th International Symposium on Polymers for Advanced Technologies, PAT -99-Tokyo, Abstract: s p.253, August 31-September. 5,1999.Google Scholar
6) Wu, Aiping, Lee, Jinkyu, Rubner, Michael F., Thin Solid Films. 327 (1998) 663.Google Scholar
7) Shiratori, Seimei S., Yamada, Masayoshi, The 5th International Symposium on Polymers for Advanced Technologies, PAT-99 Tokyo, Abstracts p.286, August 31 Sept.5,1999. Accepted in Advanced Polymer Technology (1999).Google Scholar
8) Shiratori, Seimei S., “Evaluation of EL Devices Using Ruthenium (II) Complex”, International Conference on Sceince and technologies of advanced polymers, ICAP-99, p.116–117.1999.Google Scholar
9) Shiratori, Seimei, PCT/JP99/04432.Google Scholar