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NMR Study on the Nanostructure of Co/X multilayers

Published online by Cambridge University Press:  26 February 2011

W. J. M. De Jonge,
H. A. M. De Gronckel,
K. Kopinga,
P. Panissod and
F. J. A. Den Broeder
W. J. M. De Jonge
Affiliation:
Department of Physics, Eindhoven University of Technology (EUT), 5600 MB Eindhoven, The Netherlands
H. A. M. De Gronckel
Affiliation:
Department of Physics, Eindhoven University of Technology (EUT), 5600 MB Eindhoven, The Netherlands
K. Kopinga
Affiliation:
Department of Physics, Eindhoven University of Technology (EUT), 5600 MB Eindhoven, The Netherlands
P. Panissod
Affiliation:
IPCMS, 4 rue Blaise Pascal., 67070 Strasbourg, France
F. J. A. Den Broeder
Affiliation:
Philips Research Laboratories, 5600 JA Eindhoven, The Netherlands
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Abstract

The nanostructure and local strain of \111] FCC Co/Cu and Co/Ni multilayers is studied by means of nuclear magnetic resonance. The atomic topology of the interface can be deduced from the NMR spectrum, the local strains from the shift in the hyperfine fields. The results show that the Co/Cu interface is a mixed monolayer and that the Co layers, including the interface, have uniform (tensile) strain inversely proportional to the Co thickness (within experimental error) with the proportionality constant depending on the Cu thickness. In Co/Ni the interface consists of two mixed layers and the Co layers have uniform compressive strain inversely proportional to the Co thickness.

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