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Profile Structures of Macromolecular Monolayers on Solid Substrates By X-Ray Interferometry/Holography

Published online by Cambridge University Press:  21 February 2011

J. Kent Blasie,
Sontao Xu,
Margaret Murphy,
Janine Chupa,
John P. McCauley,
Amos B. Smith III,
Lawrence J. Petacolas and
John C. Bean
J. Kent Blasie
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Sontao Xu
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Margaret Murphy
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Janine Chupa
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
John P. McCauley
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Amos B. Smith III
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
Lawrence J. Petacolas
Affiliation:
Department of Chemistry and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104
John C. Bean
Affiliation:
AT & T Bell Laboratories, Murray Hill, NJ 07974
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Abstract

Previous work has recently employed x-ray interferometry for the unique determination of the profile structures of ultrathin Langmuir-Blodgett multilayer films of Cd-arachidate and of tethered protein monolayers on the surface of Ge/Si multilayer substrates [1, 2]. These studies utilized the inorganic substrate as the reference structure for the interferometrie phasing of the meridional x-ray diffraction I (Qxy=0A-1, QZ) from the inorganic-organic composite structure. The substrates, fabricated by magnetron sputtering, contained only broad profile features (≥20 A), thereby limiting the spatial resolution of the organic profile structures so-determined. Molecular beam epitaxy (MBE) permits the fabrication of the multilayer reference structure with profile features as narrow as a single atomic monolayer, thereby providing delta-function-like features in the reference structure. The reference structure can then be tailored such that the autocorrelation function of the inorganic-organic composite profile structure [obtained by a Fourier transform of its meridional diffraction I (Qxy=0A-1, Qz) data without phase information] contains only the organic profile structure itself over a particular range of the profile coordinate z. This approach for uniquely determining the unknown profile structure of the organic overlayer is x-ray holography by analogy to simple off-axis holography with much longer wavelength radiation. We have initially utilized MBE fabricated Ge/Si multilayer substrates of the type N(Ge2Si30), e.g., for N=2 or 3 superlattice unit cells, each containing two Ge monolayers and thirty Si monolayers, to thereby determine the profile structures of four different organic overlayers, namely a) self-assembled alkylsiloxane monolayers, b) Langmuir-Blodgett cadmium alkylcarboxylate monolayers, c) a Langmuir-Blodgett Cd-arachidate head-to-head bilayer deposited on a)-above and, d) a covalently tethered protein monolayer.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 237: Symposium Ca – Interface Dynamics and Growth , 1991, 399
Copyright
Copyright © Materials Research Society 1992

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References

REFERENCES

1. Xu, S, Murphy, M. A., Amador, S. M. and Blasie, J. K., J. Phys. I, 1 (8), 1131 (1991).Google Scholar
2a. Amador, S. M., Pachence, J. M., Fischetti, R., McCauley, J. P. Jr, Smith, A. B. III, Dutton, P. L., Blasie, J. K. in Macromolecular Liquids, edited by Safinya, C. R., Safran, S. A. and Pincus, P. A., (Mat. Res. Soc. Proc. 177, Pittsburgh, PA 1989) pp. 393–398.Google Scholar
b. Amador, S. M., Pachence, J. M., Fischetti, R. F., McCauley, J. P., Smith, A. B. III, Dutton, P. L. and Blasie, J. K. The Use of Self-Assembled Monolayers to Covalently Tether Protein Monolayers to the Surface of Solid Substrates. Submitted to Langmuir. Google Scholar
3a. Cardini, G., Bareman, J. P. and Klein, M. L., Chem. Phys. Lett. 145, 493 (1988).Google Scholar
b. Bareman, J. P., Cardini, G. and Klein, M. L., Phys. Rev. Lett. 60, 2152 (1988).CrossRefGoogle Scholar
4. The elastic x-ray scattering along Qz at Qxy=0A-1 arises from the 3-dimensional electron-density distribution p(x, y, z) projected parallel to the xy-plane on to the z-axis normal to the xy-plane; the elastic x-ray scattering along Qxy at Qz=0A-1 arises from p(x, y, z) projected parallel to the z-axis on to the xy-plane.Google Scholar
5a. Pomerantz, M. and Segmüller, A., Thin Solid Films, 68, 33 (1980).Google Scholar
b. Tidswell, I. M., Ocko, B. M., Pershan, P. S., Wasserman, S. R., Whitesides, G. M. and Axe, J. D., Phys. Rev. B, 41 (2), 1111 (1990).CrossRefGoogle Scholar
6. Lesslauer, W. and Blasie, J. K., Acta Cryst. A 27, 456 (1971).Google Scholar
7a. Bean, J. C. and Sadowski, E. A., J. Vac. Sci. Technol., 20 (2), 137 (1982).Google Scholar
b. Vandenberg, J. M., Bean, J. C, Hamm, R. A. and Hull, R., Appl. Phys. Lett. 52, (14), 1152 (1988).CrossRefGoogle Scholar
8. Smith, H. M., Principles of Holography, (John Wiley, New York, 1969).Google Scholar
9. Sagiv, J., J. Am. Chem. Soc. 102, 92 (1980).CrossRefGoogle Scholar
10. See reference 1.Google Scholar
11. Fischetti, R., Filipkowski, M., Garito, A. and Blasie, J. K., Phys. Rev. B 37, 4714 (1988).CrossRefGoogle Scholar
12a. Xu, S., Petacolas, L. J., Bean, J. C. and Blasie, J. K., Submitted to J. Phys. Chem.Google Scholar
b. Murphy, M., Petacolas, L. J., Bean, J. C. and Blasie, J. K., Submitted to Langmuir.Google Scholar
c. Chupa, J., McCauley, J. P., Smith, A. B. III, Petacolas, L.J., Bean, J. C. and Blasie, J. K. To be published.Google Scholar