Hostname: page-component-7b7567c8c-7pwfn Total loading time: 0 Render date: 2026-11-15T21:23:42.563Z Has data issue: false hasContentIssue false
  • English
  • Français

Some Biassing Effects at the Electrode—Glass Interface

Published online by Cambridge University Press:  28 February 2011

Akira Doi
Akira Doi*
Affiliation:
Department of Materials, Nagoya Institute of Technology, Nagoya 466, Japan
Get access

Abstract

Informations concerning electrical biassing effects on a medium are derived, usually, from the electrodes. Therefore, we frequently encounter phenomena which are peculiar to the electrode—medium interface(s), besides those due to bulk properties. In this report naive aspect on intrinsic biassing effects at the interfaces was presented first; then, as one of extrinsic origins, the mechanism of silver injection into glass from the silver anode was discussed.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 210: Symposium L – Solid State Ionics II , 1990, 559
Copyright
Copyright © Materials Research Society 1991

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

1. Doi, A., J. Mater. Sci. 24, 749 (1989).CrossRefGoogle Scholar
2. Doi, A., J. Mater. Sci. 24, 911 (1989).CrossRefGoogle Scholar
3. Doi, A., Menjou, Y., Ishikawa, T. and Abe, Y., J. Appl. Phys. 67, 1990 (1990).CrossRefGoogle Scholar
4. Boukamp, B. A. and Huggins, R. A., Mater. Res. Bull. 13, 23 (1978).CrossRefGoogle Scholar
5. Kostysin, M. T., Michailovaskaya, E. V. and Romanenko, P. F., Soy. Phys. Solid State 8, 451 (1965).Google Scholar
6. Maruno, S., Yamada, T., Noda, M. and Kondo, Y., Jpn. J. Appl. Phys. 10, 653 (1971).CrossRefGoogle Scholar
7. Bates, J. B., Wang, J-C. and Dudney, N. J., Physics Today 35(7), 46 (1982).CrossRefGoogle Scholar
8. Agarwal, A. K. and Day, D. E., J. Am. Ceram. Soc. 65, 111 (1982).CrossRefGoogle Scholar
9. Doi, A., J. Mater. Sci. Lett. 4, 985 (1985).CrossRefGoogle Scholar
10.A. Owen, E., in Progress in Ceramic Science III, edited by Burke, J. (Pergamon, New York, 1963), p.84.Google Scholar
11. Gurney, R. W., Proc. Roy. Soc. (London) 134A, 137 (1932).Google Scholar
12. Weaver, M. J., in Inorganic Reactions and Methods XV, edited by Zuckerman, J. J. (VCH Publ., Florida, 1986), p.201.Google Scholar
13. Woodruff, D. P. and Delchar, T. A., Modern Techniques of Surface Science (Cambridge Univ. Press, Cambridge, 1986), p.201.Google Scholar
14. Walther, H., in Laser Spectroscopy (Springer, Heidelberg, 1976).Google Scholar
15. Doi, A., J. Mater. Sci. Lett. (in press)Google Scholar
16. Wallis, G., J. Am. Ceram. Soc. 53, 563 (1970).CrossRefGoogle Scholar
17. Doi, A., Miwa, T. and Mizuike, A., J. Mater. Sci. 20, 1787 (1985).CrossRefGoogle Scholar
18. Krieger, U. K. and Lanford, W. A., J. Non-Cryst. Solids 102, 50 (1988).CrossRefGoogle Scholar
19. Doi, A. and Ishikawa, T., Solid State Ionics 37, 183 (1990).CrossRefGoogle Scholar
20. Fauchey, S. and Guigonis, J., L'industrie C'eramique 641, 493 (1971).Google Scholar
21. Kaneko, T., J. Non-Cryst. Solids 120, 188 (1990).CrossRefGoogle Scholar
22. Müller, E. W. and Tsong, T. T., Field Ion Microscopy (Am. Elsevier, New York, 1969), p.56.CrossRefGoogle Scholar
23. Doi, A., Fusayama, K. and Ishikawa, T., Solid State Ionics (in press)Google Scholar