Hostname: page-component-7b7567c8c-kwt9d Total loading time: 0 Render date: 2026-11-13T10:30:06.735Z Has data issue: false hasContentIssue false
  • English
  • Français

Spatially Resolving Impedance Spectroscopy

Published online by Cambridge University Press:  10 February 2011

J. Jamnik,
J. Fleig and
J. Maier
J. Jamnik
Affiliation:
Max-Planck-Institut fiir Festkdrperforschung, Heisenbergstr. 1, 70569 Stuttgart, Germany jamnik@chemix.mpi-stuttgart.mpg.de
J. Fleig
Affiliation:
Max-Planck-Institut fiir Festkdrperforschung, Heisenbergstr. 1, 70569 Stuttgart, Germany jamnik@chemix.mpi-stuttgart.mpg.de
J. Maier
Affiliation:
Max-Planck-Institut fiir Festkdrperforschung, Heisenbergstr. 1, 70569 Stuttgart, Germany jamnik@chemix.mpi-stuttgart.mpg.de
Get access

Abstract

Two techniques for measurement of local electrical conductivity of inhomogeneous materials are described. I) A novel variant of the impedance technique for thin/thick film characterization was developed; due to the two-dimensionality of the cell set up, at different frequencies different parts of the material are probed. The technique was experimentally verified by measuring the position coordinate of a Ag strip artificially added to a AgCl film. Its application to the Ag/AgCl boundary is touched upon. II) Micro-electrodes were used to probe surface conductances and local subsurface conductivities. The technique was implemented by a home-made high impedance adapter and combined with AFM to measure the contact area. Several examples of application are shown, viz. measurements of a) the enhanced surface conductivity of mechanically polished AgCl crystals, b) the interdiffusion coefficient of Cd2+ in AgCl, and c) the grain conductivity of polycrystalline AgCl.

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

[1] Maier, J., Prog. Solid St. Chem. 23, 171 (1995).Google Scholar
[2] Bonnell, D.A., Huey, B. and Carroll, D., Solid State Ionics 75, 35 (1995).Google Scholar
[3] Schmalzried, H., Ullrich, M. and Wysk, H., Solid State Ionics 51, 91 (1992).Google Scholar
[4] Rieckert, H. and Wiemhöfer, H.D., Solid State lonics 11, 257 (1983).Google Scholar
[5] Jamnik, J., Maier, J. and Habermeier, H.-U., Physica B, 204, 57 (1995).Google Scholar
[6] Jamnik, J., Maier, J. and Pejovnik, S., Electrochim. Acta, in press.Google Scholar
[7] Bellman, R., Kalba, R.E. and Lockett, J.A., Numerical Inversion of the Laplace Transforms, (New York: American Elsevier, 1966).Google Scholar
[8] Jamnik, J., Maier, J. and Pejovnik, S., Solid State Ionics 80, 19 (1995).Google Scholar
[9] Jones, F.L., The Physics of Electrical Contacts, (Oxford University Press, 1957), p. 15.Google Scholar
[10] Fleig, J., Noll, F. and Maier, J., Solid State Ionics, submitted.Google Scholar
[11] Orton, J. W. and Blood, P., The Electrical Characterisation of Semiconductors, (Academic Press, London, 1990), p. 53.Google Scholar
[12] Fleig, J. and Maier, J., Solid State Ionics, submitted.Google Scholar
[13] Fleig, J. and Maier, J., Ber. Bunsenges. Phys. Chem., submitted.Google Scholar
[14] Holzinger, M., Fleig, J., Maier, J. and Sitte, W., Ber. Bunsenges. Phys. Chem., in press.Google Scholar