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Spin Polarized Low Energy Electron Microscopy of Surface Magnetic Structure

Published online by Cambridge University Press:  15 February 2011

M. S. Altman,
H. Pinkvos,
J. Hurst,
H. Poppa,
G. Marx and
E. Bauer
M. S. Altman
Affiliation:
Physikalisches Institut der Technischen Universität Clausthal, D-3392 Clausthal-Zellerfeld, Federal Republic of Germany
H. Pinkvos
Affiliation:
Physikalisches Institut der Technischen Universität Clausthal, D-3392 Clausthal-Zellerfeld, Federal Republic of Germany
J. Hurst
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, CA 95120
H. Poppa
Affiliation:
IBM Almaden Research Center, 650 Harry Road, San Jose, CA 95120
G. Marx
Affiliation:
Physikalisches Institut der Technischen Universität Clausthal, D-3392 Clausthal-Zellerfeld, Federal Republic of Germany
E. Bauer
Affiliation:
Physikalisches Institut der Technischen Universität Clausthal, D-3392 Clausthal-Zellerfeld, Federal Republic of Germany
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Abstract

Spin polarized low energy electron microscopy (SPLEEM) has been developed for the high resolution imaging of surface magnetic structure. The existing LEEM ha.s been modified by the incorporation of a. GaAs-type spin polarized electron gun. Large image contrast arises due to the spin-dependent exchange scattering, whifle the st.in-orbit contribution vanishes uniquely for the normal incidence/exit geometry used here. Pixel by pixel image subtraction for incident electron beams of opposite polarization yields precisely the spatially resolved Bragg reflection asymmetry observed in spin polarized low energy electron diffraction. The shallow electron penetration depth arising from the strong coulombic interaction is advantageous for separating surface behavior from the normally overwhelning bulk. Therefore, the use of transversally polarizedI electron beams allows the determination of in-plane surface magnetization directions. Fnrthermore, the parallel illumination and detection of SPLEEM makes it possible to image quickly with a. resolution better than 500 Å in the present configuration. A useful and direct. comparison between surface magnetic, structural, and topological features is made possible by the augmentation of the unique imaging capabilities of conventional LEEM with the magnetic sensitivity of SPLEEM. In this manner, the magnetic domain structure of a Co (0001) surface and in-situ grown Co filmns on Mo(110) have been determined.

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References

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