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A Statistical Approach for Some Stress Anomalies

Published online by Cambridge University Press:  22 February 2011

François Louchet and
Bernard Viguier
François Louchet
Affiliation:
LTPCM, ENSEEG, INP de Grenoble, BP 75, 38402 St Martin d’Hères, France
Bernard Viguier
Affiliation:
Institut de Génie Atomique, EPFL, 1015 Lausanne, Switzerland
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Abstract

The yield anomaly of TiAl is modelled in terms of a mechanism of mobile dislocation exhaustion. Several consequences on mechanical properties are derived, that are shown to be applicable to a wide range of anomalies, irrespective of the specific dislocation mechanisms.

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