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Structure Of Ceria Overlayer On Zirconia Crystal Studied by Surface Diffraction

Published online by Cambridge University Press:  15 February 2011

W. Dmowski,
S. Fu,
T. Egami,
R. Gorte and
J. Vhos
W. Dmowski
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
S. Fu
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
T. Egami
Affiliation:
Department of Materials and Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
R. Gorte
Affiliation:
Department of Chemical Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
J. Vhos
Affiliation:
Department of Chemical Engineering and Laboratory for Research on the Structure of Matter, University of Pennsylvania, Philadelphia, PA 19104–6272
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Abstract

We have utilized white x-ray beam and a Ge solid state detector, in energy dispersive mode, to study the diffraction from the surface layers of ceria deposited on (001) surface of Y stabilized cubic zirconia with grazing incident beam. We found that ceria forms islands, oriented epitaxially with respect to the zirconia substrate, with a lateral coherence of the order of 60 Å.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 401: Symposium G – Epitaxial Oxide Thin Films II , 1995, 115
Copyright
Copyright © Materials Research Society 1996

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References

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