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Studies of Exchange Coupling in Fe (001) Whisker/Cr/Fe Structures using BLS and Rheed Techniques.

Published online by Cambridge University Press:  03 September 2012

B. Heinrich,
M. From,
J.F. Cochran,
L. X. Liao,
Z. Celiński,
C.M. Schneider and
K. Myrtle
B. Heinrich
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
M. From
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
J.F. Cochran
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
L. X. Liao
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
Z. Celiński
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
C.M. Schneider
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
K. Myrtle
Affiliation:
Physics Department, Simon Fraser University, BURNABY, Canada, V5A1S6.
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Abstract

The conditions for an almost perfect growth of smooth Cr (001) films on an iron whisker substrate have been investigated by means of reflection high energy electron diffraction (RHEED). The exchange interaction between 20 Monolayer thick Fe (001) films separated from a bulk whisker Fe (001) substrate by a variable number of Cr (001) Monolayers (ML) has been investigated by means of Brillouin light scattering experiments (BLS). These experiments show unambiguously that the exchange coupling strength between the iron film and the iron whisker can be described by a short wavelength oscillatory term superposed on a slowly varying antiferromagnetic background. The BLS data enabled one to separate the bilinear and the biquadratic contributions to the antiferromagnetic exchange coupling terms. Both the bilinear and the biquadratic coupling strengths exhibited a short period oscillatory dependence on the Cr interlayer thickness (∼2 Monolayers). Maxima in the bilinear antiferromagnetic coupling strength occur for an odd number of Cr Monolayers. This observation is not in agreement with first principles calculations. The first phase inversion has been found to occur between 4 and 5 ML of Cr.

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References

REFERENCES

1. Unguris, J., Celotta, R.J., Pierce, D.T., Phys. Rev. Lett. 67, 140 (1991).Google Scholar
2. Purcell, S.T., Folkerts, W., Johnson, M.T., McGee, N. W. W., Jager, K., aan de Stegge, J., Zeper, W.B., Hoving, W. and Grünberg, P., Phys. Rev. Lett. 67, 903 (1991).Google Scholar
3. Unguris, J., Celotta, R.J. and Pierce, D.T., Workshop on “Magnetism and Structure in systems of Reduced Dimension”, Cargese, Corsica, France, June 1992, to be published in NATO ASI series.Google Scholar
4. Grünberg, P., Democritov, S., Fuss, A., Schreiber, R., Wolf, J.A., and Purcell, S.T., JMMM 104–107. 1734 (1992).Google Scholar
5. Heinrich, B., Celiński, Z., Cochran, J.F., and From, M., Workshop on “Magnetism and Structure in systems of Reduced Dimension”, Cargese, Corsica, France, June 1992, to be published in the NATO ASI series.Google Scholar
6. Grünberg, P.A., Fuss, A., Leng, Q., Schreiber, R., Wolf, J.A., Workshop on “Magnetism and Structure in systems of Reduced Dimension”, Cargese, Corsica, France, June 1992, to be published in the NATO ASI series.Google Scholar
7. Shi, Zhu-Pei, Levy, P. M. and Fry, J.L., Phys. Rev. Lett., 69, 3678 (1992).Google Scholar
8. Grünberg, P., Progress in Surface Science, 18, 1 (1985).Google Scholar
9. k-Space Associates, 2379 Leslie Circle, Ann Arbor, Michigan 48105.Google Scholar
10. Arrott, A.S., Heinrich, B. and Purcell, S.T., Kinetics of Ordering and Growth at Surfaces, edited by Legally, M.G., Plenum Press, New York, 321 (1990).Google Scholar
11. Heinrich, B., Cochran, J.F., Kowalewski, M., Kirschner, J., Celiński, Z., Arrott, A.S., and Myrtle, K., Phys. Rev. B, 44, 9348 (1991).Google Scholar
12. Mills, D.L., Phys. Rev. B, 22, 12306 (1989).Google Scholar
13. O'Handley, R.C. and Woods, J.P., Phys. Rev. B, 42, 6568 (1990).Google Scholar
14. Slonczewski, J.C., Phys. Rev. Lett. 67, 3172 (1991).Google Scholar
15. (a) Hasegawa, H., Phys. Rev. B 42, 2368 (1990)Google Scholar
(b) Herman, F., Sticht, J., and van Schilfgaarde, M., J. Appl. Phys. 69, 4783 (1991).Google Scholar
(c) Stoeffler, D. and Gautier, F., Phys. Rev. B 44, 10389 (1991); J. Magn. Magn. Mater. 104–107, 1819 (1992).Google Scholar
16. Camley, R.E. and Mills, D.L., Phys. Rev. B, 18, 4821 (1978).Google Scholar