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Study of Surface Defects With the Reflected Electrons

Published online by Cambridge University Press:  26 February 2011

Tung Hsu
Tung Hsu*
Affiliation:
Department of Materials Science and Engineering, University of Utah, Salt Lake City, UT 84112, U.S.A.
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Abstract:

Studying crystal surfaces using the forward scattered high energy electrons Is discussed.Performance and applications of the basic REM and several variations of this technique are presented.

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Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 209: Symposium K – Defects in Materials , 1990, 629
Copyright
Copyright © Materials Research Society 1991

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References

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