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Using Interactive Multimedia Tools to Teach Materials Characterization Techniques in the Undergraduate Curriculum

Published online by Cambridge University Press:  11 February 2011

Karin Prüβner,
Klaus Pingel,
Jens Becker,
Horst-Peter Dressel,
Alexander Undynko,
Christof Reiner,
Marc Schlosser and
Hans-Jürgen Christ
Karin Prüβner
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germanynow at: Department of Materials Science and Engineering, University of Florida, Gainesville, FL, USA
Klaus Pingel
Affiliation:
Institut für Physik, University of Siegen, Germany
Jens Becker
Affiliation:
Institut für Physik, University of Siegen, Germany
Horst-Peter Dressel
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germany
Alexander Undynko
Affiliation:
Institut für Physik, University of Siegen, Germany
Christof Reiner
Affiliation:
Institut für Anorganische Chemie, University of Siegen, Germany
Marc Schlosser
Affiliation:
Institut für Anorganische Chemie, University of Siegen, Germany
Hans-Jürgen Christ
Affiliation:
Institut für Werkstofftechnik, University of Siegen, Germany
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Abstract

The paper describes an ongoing project at the University of Siegen to develop multimedia teaching/learning software for materials characterization techniques in an effort to improve the quality of teaching and learning and to increase interest in scientific and engineering subjects in younger students. We have developed a modular web-based teaching platform that uses multimedia tools to provide access to and information about state-of-the-art analytical techniques, visualize complex physical concepts, and use interactive and animated modules to improve student learning.

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References

REFERENCES

1. National Science Board, Science and Engineering Indicators – 2002 (NSB-02–01), Arlington VA, National Science Foundation, 2002.Google Scholar
2. Schmidt, P.F. et al, Praxis der Rasterelektronenmikroskopie und Mikrobereichsanalyse, Expert-Verlag, 2000.Google Scholar
3. Goldstein, J.I., Newbury, D.E., Echlin, P., Joy, D.C., Romig, A.D., Lyman, Ch.E., Fiori, C., and Lifshin, E., Scanning Electron Microscopy and X-Ray Microanalysis, 2nd ed., Plenum Press, New York and London, 1992.Google Scholar
4. Williams, D.B., Carter, C.B., Transmission Electron Microscopy, Plenum Press, New York and London, 1996.Google Scholar
5. Fultz, B., Howe, J.M., Transmission Electron Microscopy and Diffractometry of Materials, Springer-Verlag, Berlin, Heidelberg, New York, 2001.Google Scholar
6. Prüβner, K., Pingel, K., Dressel, H.-P., Becker, J., Reiner, C., Schlosser, M. and Christ, H.-J., J. Mat. Education 23 (2001) 101.Google Scholar
7. Reimer, L., CD-ROM Rasterelektronenmikroskopie, University of Münster, Germany.Google Scholar
8. Fels, A., on-line course Rasterelektronenmikroskopie, http://www.reclot.de/kapitel/0kurs.htm, University of Stuttgart, Germany.Google Scholar
9. JEOL, Guide to Scanning Electron Microscope Observation, http://www.jeol.com/sem_gde/tbcontd.html.Google Scholar
10. bigchalk – The Education network: http://www.bigchalk.com/cgi-bin/WebObjects/WOPortal.woa/wa/BCPageDA/sec~ga~16235~~ Google Scholar
11. Joy, D.C., Monte Carlo Modeling for Electron Microscopy and Microanalysis, Oxford University Press, 1995.Google Scholar