Hostname: page-component-7b7567c8c-fvjsw Total loading time: 0 Render date: 2026-11-14T23:39:52.533Z Has data issue: false hasContentIssue false
  • English
  • Français

Wavelength Selective Charge Storage in self-assembled InGaAs-GaAs Quantum Dots

Published online by Cambridge University Press:  11 February 2011

M. Kroutvar,
Y. Ducommun,
J. J. Finley,
M. Bichler,
G. Abstreiter and
A. Zrenner
M. Kroutvar
Affiliation:
Walter Schottky Institut, Technische Universität München, D-85748, Garching, Germany
Y. Ducommun
Affiliation:
Walter Schottky Institut, Technische Universität München, D-85748, Garching, Germany
J. J. Finley
Affiliation:
Walter Schottky Institut, Technische Universität München, D-85748, Garching, Germany
M. Bichler
Affiliation:
Walter Schottky Institut, Technische Universität München, D-85748, Garching, Germany
G. Abstreiter
Affiliation:
Walter Schottky Institut, Technische Universität München, D-85748, Garching, Germany
A. Zrenner
Affiliation:
University Paderborn, FB6, Warburger Str. 100, 33098 Paderborn, Germany
Get access

Abstract

We present the first demonstration of spectrally selective charge storage in self-assembled quantum dots that utilizes optical charge generation and readout of the stored charge distribution. Resonant optical excitation charges only a sub-ensemble of the inhomogeneous broadened dots. The optical readout process directly recovers the spectral distribution of stored charges. Wavelength selectivity is demonstrated in a two-color experiment exhibiting charge storage in two independent QD sub-ensembles. Resonant charge storage is observed at least up to 85K depending on excitation energy. Lack of time evolution of the spectral emission indicates charge storage times Δt much longer than 25μs.

Information

Type
Research Article
Information
MRS Online Proceedings Library (OPL) , Volume 737 , 2002, E6.3
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

Article purchase

Temporarily unavailable

References

REFERENCES

Finley, J. J., Fry, P. W., Ashmore, A. D., Lemaître, A., Tartakovskii, A. I., Oulton, R., Mowbray, D. J., Hopkinson, M., Buckle, P. D., Maksym, P. A., and Skolnick, M. S., Phys. Rev. B 63, 161305 (2001)Google Scholar
Hartmann, A., Ducommun, Y., Kapon, E., Hohenester, U., and Molinari, E., Phys. Rev. Lett. 84, 5648 (2000)Google Scholar
[3] Findeis, F., Baier, M., Zrenner, A., Bichler, M., Abstreiter, G., Hohenester, U., and Molinari, E., Phys. Rev. B 63, 121309 (2001)Google Scholar
[4] Oulton, R., Finley, J. J., Ashmore, A. D., Gregory, I. S., Mowbray, D. J., Skolnick, M. S., Steer, M. J., Liew, San-Lin, Migliorato, M. A., and Cullis, A. J., Phys. Rev. B 66, 045313 (2002)Google Scholar
[5] Findeis, F., Baier, M., Beham, E., Zrenner, A., and Abstreiter, G., Appl. Phys. Lett. 78, 2958 (2001)Google Scholar
[6] Beham, E., Zrenner, A., Findeis, F., Bichler, M., and Abstreiter, G., Appl. Phys. Lett. 79, 2808 (2001)Google Scholar
[7] Zrenner, A., Beham, E., Stufler, S., Findeis, F., Bichler, M., and Abstreiter, G., Nature 418, 612 (2002)Google Scholar
[8] Imamoglu, A., Awschalom, D. D., Burkard, G., DiViVincenzo, D. P., Loss, D., Sherwin, M. and Small, A., Phys. Rev. Lett. 83, 4204, (1999)Google Scholar
[9] Burkard, G., Loss, D., DiVincenzo, D. P., Phys. Rev. B 59, 2070 (1999).Google Scholar
[10] Muto, S., Jpn. J. Appl. Phys. 34, 210 (1995).Google Scholar
[11] Imamura, K., Sugiyama, Y., Nakata, Y., Muto, S., Yokoyama., N., Jpn. J. Appl. Phys. 34, 1445 (1995).Google Scholar
[12] Finley, J. J., Skalitz, M., Arzberger, M., Zrenner, A., Böhm, G., Abstreiter, G., Appl. Phys. Lett. 73, 2618 (1998).Google Scholar
[13] Yusa, G. and Sakaki, H., Appl. Phys. Lett. 70, 345 (1997)Google Scholar
[14] Lundstrom, T., Schoenfeld, W., Lee, H., Petroff, P. M., Science 286, 2312 (1999).Google Scholar
[15] Bimberg, D., Grundmann, M., Ledentsov, N. N., John Wiley & Sons, New York (1999)Google Scholar
[16] Lemaître, A., Ashmore, A. D., Finley, J. J., Mowbray, D. J., Skolnick, M. S., Hopkinson, M., and Krauss, T. F., Phys. Rev. B 63, 161309 (2001)Google Scholar
[17] Heitz, R., Born, H., Guffarth, F., Stier, O., Schliwa, A., Hoffmann, A., and Bimberg, D., Phys. Rev. B 64, 241305 (2001)Google Scholar
[18] Borri, P., Langbein, W., Schneider, S., Woggon, U., Sellin, R. L., Ouyang, D., and Bimberg, D., Phys. Rev. Lett. 87, 157401 (2001)Google Scholar