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X-Ray Topography

Published online by Cambridge University Press:  15 February 2011

Michael Dudley
Michael Dudley*
Affiliation:
Department of Materials Science & Engineering, State University of New York at Stony Brook, Stony Brook, NY 11794-2275
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Abstract

A review of the technique of White Beam Synchrotron X-ray Topography is presented along with some examples of its applications in materials science. Among the topics covered are: the characterization of growth defects in KTiOPO4, ZnTe, and SiC single crystals; studies of phase transitions in perovskite-like crystals; and studies of rapid thermal processing damage in semiconductors. Methodologies for analyzing dislocations, twins (rotational, mirror and inversion twins), precipitates and other crystallographic defects, will be reviewed.

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References

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