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Analysis of Oxide Surfaces by High Resolution Transmission Electron Microscopy

Published online by Cambridge University Press:  25 February 2011

W. Krakow and
V. Castano
W. Krakow
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598 USA
V. Castano
Affiliation:
IBM Corporation, Thomas J. Watson Research Center, P.O. Box 218, Yorktown Heights, NY 10598 USA
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Abstract

We have investigated the surface structure of oxides with low atomic number metallic components (Cu and Al) using two different high resolution electron microscopy techniques. First, using flat-on microscopy normal to the surface, we have studied the epitaxy of vapor deposited Cu on single crystal (110) and (111) surfaces of Au and the subsequent oxidation of the Cu under ambient conditions. Three structural variants of (110) oriented Cu2O were found relative to the underlying ( 11I) Au film and the oxide surface has a shifted, 1/2[110], (1 × 1) surface reconstruction. A (211) Cu2O structure was found for the (110) Au film orientation. This case has two structural variants at 90° to each other where one of these variants exhibits surface roughness of ∼5Å. The second structure has atomic step heights of ∼6Å, and a rectangular surface supercell structure of ∼3.0Å × 7.39Å due to (211) bulk lattice layers.

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