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Analysis of the Structure of Grain Boundaries Normal to the Boundary Plane Using Diffraction Techniques

Published online by Cambridge University Press:  25 February 2011

M. D. Vaudin,
F. Schmückle,
P. A. Lamarre and
S. L. Sass
M. D. Vaudin
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
F. Schmückle
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
P. A. Lamarre
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
S. L. Sass
Affiliation:
Department of Materials Science & Engineering, Bard Hall, Cornell University, Ithaca, NY 14853, U.S.A.
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Abstract

By recording the intensity of electron scattering along the reciprocal lattice direction normal to the interface plane of a grain boundary, diffraction data is obtained which is sensitive to the boundary structure along this direction. Kinematical calculations of the diffracted intensity profile normal to the interface show that such diffraction data can provide information on the local expansion at the interface and the rigid body translation between the two grains. Electron diffraction data obtained from a variety of different boundaries are presented and analyzed by comparison with intensity profiles calculated for various model boundary structures.

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